Etracker Debug:
	et_pagename = "it - Information Technology|itit|C|[EN]"
	
        
Jump to ContentJump to Main Navigation

Longest established German IT journal

it - Information Technology

METHODS AND APPLICATIONS OF INFORMATICS AND INFORMATION TECHNOLOGY

Editor-in-Chief: Molitor, Paul

6 Issues per year

VolumeIssuePage

Issues

Volume 56, Issue 4 (Aug 2014)

Special Issue dedicated to Bernd Becker on the occasion of his 60th birthday: Testing Integrated Circuits / Rolf Drechsler

Frontmatter

Page i

Published Online: 07/21/2014

Editorial

Preface

Molitor, Paul

Page 147

Published Online: 07/21/2014

Editorial

Testing integrated circuits

Drechsler, Rolf

Page 148

Published Online: 07/21/2014

Special Issue

On achieving minimal size test sets for scan designs

Reddy, Sudhakar M. / Zhang, Zhuo

Page 150

Published Online: 07/21/2014

An effective fault ordering heuristic for SAT-based dynamic test compaction techniques

Eggersglüß, Stephan / Drechsler, Rolf

Page 157

Published Online: 07/21/2014

SAT-based ATPG beyond stuck-at fault testing

Hellebrand, Sybille / Wunderlich, Hans-Joachim

Page 165

Published Online: 07/21/2014

Testing for gate oxide short defects using the detectability interval paradigm

Galliere, Jean-Marc / Azais, Florence / Comte, Mariane / Renovell, Michel

Page 173

Published Online: 07/21/2014

Behavior of stochastic circuits under severe error conditions

Chen, Te-Hsuan / Alaghi, Armin / Hayes, John P.

Page 182

Published Online: 07/21/2014

Hardware security and test: Friends or enemies?

Polian, Ilia

Page 192

Published Online: 07/21/2014

Comments (0)

Please log in or register to comment.
Users without a subscription are not able to see the full content. Please, subscribe or login to access all content.