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The aim of the journal is to enhance the world-wide exchange of information on the advancements in the field of measurement sciences and technology, with particular focus on the areas where the activity of other metrology-related journals is insufficient. The main priority is given to supporting the young researchers in their scientific development – by publishing research results recorded in their Ph.D. and D.Sc. theses. Fostering of publication activities in the countries of Central and Eastern Europe is also an important element of the journal's mission. The substance-related priority is given to IT-based measurement methods and techniques, especially to DSP-based, AI-based and wireless instrumentation.
More information: on website www.metrology.pg.gda.pl
Aims and Scope
Why subscribe and read
Metrology and Measurement Systems is an international journal, issued quarterly under auspices of the Polish Academy of Sciences. It is a peer-reviewed journal, launched in 1988, since 2001 it appears in English. Actually is edited both in paper and electronic format. The journal is source of high quality information from research, development and applications of measurement sciences and technology. Over 20 years of experience in publishing original paper dealing with various measurement methods and instrumentations applied in many field of engineering and medicine.
- Wide and important for research and engineering activity list of topics covered by the journal: general principles of measurement, measurement of physical, chemical and biological quantities, medical measurements, sensors and transducers, measurement data acquisition, measurement signal transmission and processing, measurement systems and microsystems, internet-based and wireless-communication-based measurements, virtual and AI-based instruments, design and manufacture of instruments.
- Fair and constructive peer review.
- Short publication cycle – average 6 months.
- Free language assistance for authors from non-English speaking regions.
- Type of Publication:
Journal Citation Reports/Science, Science Citation Index Expanded, Publishing and Information Services-INSPEC, Scopus, Index Copernicus, Google Scholar, CSA Technology Research, CSA High Tech Research Database, CSA Solid State & Superconductivity, TEMA
Janusz Smulko, Gdansk University of Technology, Poland
International Programme Committee
Roman Z. Morawski, Chairman, Warsaw University of Technology, Poland
Eric Benoit, Université de Savoie, France
Wojtek J. Bock, Université du Québec en Outaouais, Canada
Martin Burghoff, Physikalisch-Technische Bundesanstalt, Germany
Ramachandra R. Dasari, Massachusetts Institute of Technology, USA
Numan Durakbasa, Vienna University of Technology, Austria
Mauricio N. Frota, Catholic University Rio de Janeiro, Brazil
Marian P. Kaźmierkowski, Warsaw University of Technology, Poland
Laszlo Kish, Texas A&M University, USA
Włodek Kulesza, Blekinge Institute of Technology, Sweden
Luca Mari, Cattaneo University, Italy
Janusz Mroczka, Wroclaw University of Technology, Poland
Sergey V. Muravyov, Tomsk Polytechnic University, Russia
Jan Obrzut, National Institute of Standards and Technology, USA
Toshiro Ono, Okayama University of Science, Japan
Paul P.L. Regtien, University of Twente, The Netherlands
Antoni Rogalski, Military University of Technology, Poland
Antonio Cruz Serra, Institute of Telecommunications, Portugal
Richard Thorn, Technical University of Łódź, Poland/ University of Bergen, Norway
Rainer Tutsch, Technical University Braunschweig, Germany
Leo van Biesen, Vrije Universiteit Brussel, Belgium
Wiesław Woliński, Warsaw University of Technology, Poland
Zbigniew Bielecki, Military University of Technology, Poland
Marcantonio Catelani, University of Florence, Italy
Vladimir Dimchev, Ss. Cyril and Methodius University, Macedonia
Krzysztof Duda, AGH University of Science and Technology, Poland
Janusz Gajda, AGH University of Science and Technology, Poland
Teodor Gotszalk, Wroclaw University of Technology, Poland
Domenico Grimaldi, University of Calabria, Italy
Ireneusz Jabłoński, Wroclaw University of Technology, Poland
Piotr Jasiński, Gdansk University of Technology, Poland
Czesław Łukianowicz, Koszalin University of Technology, Poland
Fernando Puente León, University Karlsruhe, Germany
Remigiusz Rak, Warsaw University of Technology, Poland
Wiesław Wysocki, Gdansk University of Technology, Poland
Katarzyna Uliczny, Gdansk University of Technology, Poland
Editorial Office of Metrology and Measurement Systems
tel.: (0-58) 347-1357
fax: (058) 347-2255