Metrology and Measurement Systems

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ISSN:
2300-1941

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Metrology and Measurement Systems

The Journal of Committee on Metrology and Scientific Instrumentation of Polish Academy of Sciences


IMPACT FACTOR increased in 2014: 0.925
5-year IMPACT FACTOR: 0.947

SCImago Journal Rank (SJR) 2014: 0.596
Source Normalized Impact per Paper (SNIP) 2014: 1.232
Impact per Publication (IPP) 2014: 1.093

DE GRUYTER OPEN

Open Access

The aim of the journal is to enhance the world-wide exchange of information on the advancements in the field of measurement sciences and technology, with particular focus on the areas where the activity of other metrology-related journals is insufficient. The main priority is given to supporting the young researchers in their scientific development – by publishing research results recorded in their Ph.D. and D.Sc. theses. Fostering of publication activities in the countries of Central and Eastern Europe is also an important element of the journal's mission. The substance-related priority is given to IT-based measurement methods and techniques, especially to DSP-based, AI-based and wireless instrumentation.
More information: on website www.metrology.pg.gda.pl

Aims and Scope

Why subscribe and read

Metrology and Measurement Systems is an international journal, issued quarterly under auspices of the Polish Academy of Sciences. It is a peer-reviewed journal, launched in 1988, since 2001 it appears in English. Actually is edited both in paper and electronic format. The journal is source of high quality information from research, development and applications of measurement sciences and technology. Over 20 years of experience in publishing original paper dealing with various measurement methods and instrumentations applied in many field of engineering and medicine.

Why submit

  • Wide and important for research and engineering activity list of topics covered by the journal: general principles of measurement, measurement of physical, chemical and biological quantities, medical measurements, sensors and transducers, measurement data acquisition, measurement signal transmission and processing, measurement systems and microsystems, internet-based and wireless-communication-based measurements, virtual and AI-based instruments, design and manufacture of instruments.
  • Fair and constructive peer review.
  • Short publication cycle – average 6 months.
  • Free language assistance for authors from non-English speaking regions.

Instructions for Authors

Please submit your manuscripts to Metrology and Measurement Systems via Internet Editorial System, accessible at http://www.editorialsystem.com/mms

Metrology and Measurement Systems is covered by the following services:

  • Arianta
  • Baidu Scholar
  • BazTech
  • Celdes
  • CNKI Scholar (China National Knowledge Infrastructure)
  • CNPIEC
  • DOAJ
  • EBSCO (relevant databases)
  • EBSCO Discovery Service
  • Elsevier - Compendex
  • Elsevier - Engineering Village
  • Elsevier - SCOPUS
  • Genamics JournalSeek
  • Google Scholar
  • Index Copernicus
  • Inspec
  • J-Gate
  • JournalTOCs
  • Naviga (Softweco)
  • Primo Central (ExLibris)
  • ProQuest (relevant databases)
  • ReadCube
  • ResearchGate
  • SCImago (SJR)
  • Summon (Serials Solutions/ProQuest)
  • TDOne (TDNet)
  • TEMA Technik und Management
  • Thomson Reuters - Journal Citation Reports/Science Edition
  • Thomson Reuters - Science Citation Index Expanded
  • Ulrich's Periodicals Directory/ulrichsweb
  • WorldCat (OCLC)

Editor-in-Chief
Janusz Smulko, Gdansk University of Technology, Poland

International Programme Committee
Roman Z. Morawski, Chairman, Warsaw University of Technology, Poland
Eric Benoit, Université de Savoie, France
Wojtek J. Bock, Université du Québec en Outaouais, Canada
Martin Burghoff, Physikalisch-Technische Bundesanstalt, Germany
Ramachandra R. Dasari, Massachusetts Institute of Technology, USA
Numan Durakbasa, Vienna University of Technology, Austria
Mauricio N. Frota, Catholic University Rio de Janeiro, Brazil
Marian P. Kaźmierkowski, Warsaw University of Technology, Poland
Laszlo Kish, Texas A&M University, USA
Włodek Kulesza, Blekinge Institute of Technology, Sweden
Luca Mari, Cattaneo University, Italy
Janusz Mroczka, Wroclaw University of Technology, Poland
Sergey V. Muravyov, Tomsk Polytechnic University, Russia
Jan Obrzut, National Institute of Standards and Technology, USA
Toshiro Ono, Okayama University of Science, Japan
Paul P.L. Regtien, University of Twente, The Netherlands
Antoni Rogalski, Military University of Technology, Poland
Antonio Cruz Serra, Institute of Telecommunications, Portugal
Richard Thorn, Technical University of Łódź, Poland/ University of Bergen, Norway
Rainer Tutsch, Technical University Braunschweig, Germany
Leo van Biesen, Vrije Universiteit Brussel, Belgium
Wiesław Woliński, Warsaw University of Technology, Poland

Associate Editors
Zbigniew Bielecki, Military University of Technology, Poland
Marcantonio Catelani, University of Florence, Italy
Vladimir Dimchev, Ss. Cyril and Methodius University, Macedonia
Krzysztof Duda, AGH University of Science and Technology, Poland
Janusz Gajda, AGH University of Science and Technology, Poland
Teodor Gotszalk, Wroclaw University of Technology, Poland
Domenico Grimaldi, University of Calabria, Italy
Ireneusz Jabłoński, Wroclaw University of Technology, Poland
Piotr Jasiński, Gdansk University of Technology, Poland
Piotr Kisała, Lublin University of Technology, Poland
Czesław Łukianowicz, Koszalin University of Technology, Poland
Fernando Puente León, University Karlsruhe, Germany
Remigiusz Rak, Warsaw University of Technology, Poland
Roman Szewczyk, Warsaw University of Technology, Poland

Language Editors
Andrzej Stankiewicz, Gdansk University of Technology, Poland

Technical Editors
Agnieszka Kondratowicz, Gdansk University of Technology, Poland

Contact
Editorial Office of Metrology and Measurement Systems
metrology@pg.gda.pl

tel.: (0-58) 347-1357

Publisher
DE GRUYTER OPEN
Bogumiła Zuga 32A Str.
01-811 Warsaw, Poland
T: +48 22 701 50 15

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