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Opto-Electronics Review

Editor-in-Chief: Jaroszewicz, Leszek


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1896-3757
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Direct measurement of group dispersion of optical components using white-light spectral interferometry

1Department of Physics, Technical University of Ostrava, 17. listopadu 15, 708-33, Ostrava-Poruba, Czech Republic

© 2007 SEP, Warsaw. This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License. (CC BY-NC-ND 3.0)

Citation Information: Opto-Electronics Review. Volume 15, Issue 3, Pages 144–148, ISSN (Online) 1896-3757, DOI: 10.2478/s11772-007-0010-z, September 2007

Publication History

Published Online:
2007-09-01

Abstract

We present a simple white-light spectral interferometric technique employing a low-resolution spectrometer for a direct measurement of the group dispersion of optical components over a wide wavelength range. The technique utilizes an unbalanced Mach-Zehnder interferometer with a component under test inserted in one arm and the other arm with adjustable path length. We record a series of spectral interferograms to measure the equalization wavelength as a function of the path length difference. We measure the absolute group refractive index as a function of wavelength for a quartz crystal of known thickness and the relative one for optical fiber. In the latter case we use a microscope objective in front and a lens behind the fiber and subtract their group dispersion, which is measured by a technique of tandem interferometry including also a Michelson interferometer.

Keywords: spectral interferometry; white-light source; low-resolution spectrometer; Mach-Zehnder interferometer; group refractive index; dispersion; quartz crystal; holey fiber

  • [1] W.H. Knox, N.M. Pearson, K.D. Li, and C.A. Hirlimann, “Interferometric measurements of femtosecond group delay in optical components”, Opt. Lett. 13, 574–576 (1988). http://dx.doi.org/10.1364/OL.13.000574 [CrossRef]

  • [2] S. Diddams and J.C. Diels, “Dispersion measurements with white-light interferometry”, J. Opt. Soc. B13, 1120–1128 (1995).

  • [3] M. Galli, F. Marabelli, and G. Gizzetti, “Direct measurement of refractive-index dispersion of transparent media by white-light interferometry”, Appl. Opt. 42, 3910–3914 (2003).

  • [4] C. Sainz, P. Jourdain, R. Escalona, and J. Calatroni, “Real time interferometric measurements of dispersion curves”, Opt. Commun. 110, 381–390 (1994). http://dx.doi.org/10.1016/0030-4018(94)90442-1 [CrossRef]

  • [5] V.N. Kumar and D.N. Rao, “Using interference in the frequency domain for precise determination of the thickness and refractive indices of normal dispersive materials”, J. Opt. Soc. B12, 1559–1563 (1995). [CrossRef]

  • [6] Y. Liang and C.H. Grover, “Modified white-light Mach-Zehnder interferometer for direct group-delay measurements”, Appl. Opt. 37, 4105–4111 (1998). http://dx.doi.org/10.1364/AO.37.004105 [CrossRef]

  • [7] H. Delbarre, C. Przygodzki, M. Tassou, and D. Boucher, “High-precision index measurement in anisotropic crystals using white-light spectral interferometry”, Appl. Phys. B70, 45–51 (2000). http://dx.doi.org/10.1007/s003400050006 [CrossRef]

  • [8] P. Hlubina, “White-light spectral interferometry with the uncompensated Michelson interferometer and the group refractive index dispersion in fused silica”, Opt. Commun. 193, 1–7 (2001). http://dx.doi.org/10.1016/S0030-4018(01)01235-4 [CrossRef]

  • [9] P. Hlubina and W. Urbanczyk, “Dispersion of the group birefringence of a calcite crystal measured by white-light spectral interferometry”, Meas. Sci. Technol. 16, 1267–1271 (2005). http://dx.doi.org/10.1088/0957-0233/16/6/005 [CrossRef]

  • [10] P. Hlubina and I. Gurov, “Spectral interferograms including the equalization wavelengths processed by autoconvolution method”, Proc. SPIE 5064, 198–205 (2003). http://dx.doi.org/10.1117/12.501517 [CrossRef]

  • [11] G. Ghosh, “Dispersion-equation coefficients for the refractive index and birefringence of calcite and quartz crystal”, Opt. Commun. 163, 95–102 (1999). http://dx.doi.org/10.1016/S0030-4018(99)00091-7 [CrossRef]

  • [12] P. Hlubina, D. Ciprian, and L. Knyblová, “Direct measurement of dispersion of the group refractive indices of quartz crystal by white-light spectral interferometry”, Opt. Commun. 269, 8–13 (2007). http://dx.doi.org/10.1016/j.optcom.2006.07.049 [CrossRef]

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