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Zeitschrift für Kristallographie - Crystalline Materials

Ed. by Antipov, Evgeny / Bismayer, Ulrich / Huppertz, Hubert / Petrícek, Václav / Pöttgen, Rainer / Schmahl, Wolfgang / Tiekink, E. R. T. / Zou, Xiaodong

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Problems in measuring diffuse X-ray scattering

T. Richard Welberry / Darren J. Goossens / Aidan P. Heerdegen / Peter L. Lee

Citation Information: Zeitschrift für Kristallographie. Volume 220, Issue 12/2005, Pages 1052–1058, ISSN (Print) 0044-2968, DOI: 10.1524/zkri.2005.220.12_2005.1052, July 2010

Publication History

Received:
December 21, 2004
Accepted:
April 15, 2005
Published Online:
2010-07-28

Abstract

Problems encountered in making measurements of diffuse X-ray scattering are discussed. These generally arise from the need to measure very weak scattering in the presence of very strong scattering (Bragg peaks) using multi-detectors of various kinds. The problems are not confined to synchrotron experiments but may even occur using a tube source in the home laboratory. Specific details are given of experiments using 80.725 keV X-rays and a mar345 Image Plate detector on the 1-ID beamline of XOR at the Advanced Photon Source. In these a severe ‘blooming’ artefact which occurred around some strong Bragg peaks was traced to fluorescence from a steel mounting plate in the detector when strong Bragg peaks were incident. Algorithms developed to remove these artefacts from the data are described.

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