Jump to ContentJump to Main Navigation

Founded in 1877!

Zeitschrift für Kristallographie - Crystalline Materials

Ed. by Antipov, Evgeny / Bismayer, Ulrich / Huppertz, Hubert / Petrícek, Václav / Pöttgen, Rainer / Schmahl, Wolfgang / Tiekink, E. R. T. / Zou, Xiaodong

12 Issues per year

Increased IMPACT FACTOR 2012: 1.241

VolumeIssuePage

Issues

Open Access

Instrumental profile of MYTHEN detector in Debye-Scherrer geometry

Fabia Gozzo* / A. Cervellino1 / Matteo Leoni2 / Paolo Scardi3 / A. Bergamaschi4 / B. Schmitt5

1 Paul Scherrer Institute, Swiss Light Source, Villigen PSI, Schweiz

2 University of Trento, Department of Materials Engineering and Industrial, Trento, Italien

3 University of Trento, Department of Materials Engineering and Industrial, Trento, Italien

4 Paul Scherrer Institut, Swiss Light Source, Villigen PSI, Schweiz

5 Paul Scherrer Institut, Swiss Light Source, Villigen PSI, Schweiz

* Correspondence address: Paul Scherrer Institute, Swiss Light Source, Villigen PSI, Schweiz,

Citation Information: Zeitschrift für Kristallographie Crystalline Materials. Volume 225, Issue 12, Pages 616–624, ISSN (Print) 0044-2968, DOI: 10.1524/zkri.2010.1345, October 2010

Publication History

Published Online:
2010-10-13

Abstract

The main aberrations affecting data collected with 1D position sensitive detectors in Debye-Scherrer capillary geometry are examined, and analytical corrections proposed. The equations are implemented in two of the most advanced software based on the Rietveld and Whole Powder Pattern Modelling methods, respectively, for structure and microstructure analysis. Application to MYTHEN, a fast single photon counting detector developed at the Swiss Light Source, is discussed in detail.

Keywords: Instrumental line profile; Profile aberrations; Synchrotron radiation XRPD; Debye-Scherrer geometry; Position sensitive detector

Comments (0)

Please log in or register to comment.