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Hansen, A., Dietl, B., Etter, M., et al. (2017). Temperature-dependent synchrotron X-ray diffraction, pair distribution function and susceptibility study on the layered compound CrTe3. Zeitschrift für Kristallographie - Crystalline Materials, 233(6), pp. 361-370. Retrieved 23 Feb. 2019, from doi:10.1515/zkri-2017-2100