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Quantum Measurements and Quantum Metrology: Topical Issue on Quantum-enhanced metrology and sensing for quantum technologies

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Sensing and metrology are at the core of the development of many modern technologies, from mobile telecommunication to geo-positioning systems, petroleum-well mapping to medicine.

A significant boost in the performance of sensors and metrological protocols can come from the use of quantum mechanical strategies and probes: Quantum-enhanced metrology allows for the performance of measurements with a precision that surpasses any classical limitation, and will enable a new generation of sensors of unprecedented sensitivity. The domain of application of such emerging quantum technologies ranges from the definition of frequency standards, the detection of gravitational waves, the synchronization of clocks, and the enhancement of imaging and lithography, among others. 

This Special Issue in Quantum Measurements and Quantum Metrology aims at reviewing the state-of-the-art in quantum metrology and quantum sensing and identify the current efforts, both theoretical and experimental, form their further development. This is an inherently multi-faceted endeavours with repercussions in the broad areas of quantum open-system dynamics, quantum information, quantum control, and quantum engineering. We welcome submissions addressing each of these areas, and tackling the core topic of the Special Issue. 

Guest Editor: Mauro Paternostro



Before submission authors should carefully read the Instructions for Authors, which are located at 


All submissions to the Special Issue must be made electronically at


and will undergo the standard peer-review system. When entering your submission choose the option Special Issue on Quantum-enhanced metrology and sensing for quantum technologies.

Submissions for the special issue are now open.