Skip to content
Publicly Available Published by De Gruyter January 1, 2009

General Aspects of Trace Analytical Methods—IV. Recommendations for Nomenclature, Standard Procedures and Reporting of Experimental Data for Surface Analysis Techniques


1 , 2012, no. , vol. , p. 10.1016/j.jhazmat.2012.07.001Parsons Chris, Grabulosa Eva Margui, Pili Eric, Floor Geerke H., Roman-Ross Gabriela, Charlet Laurent. Journal of Hazardous MaterialsJournal of Hazardous Materials03043894"Quantification of trace arsenic in soils by Field-Portable X-Ray Fluorescence Spectrometry: Considerations for sample preparation and measurement conditions" . Search in Google Scholar

2 , 2012, no. , vol. 76, p. 17510.1016/j.sab.2012.06.005Reinsberg K.-G., Schumacher C., Tempez A., Nielsch K., Broekaert J.A.C. Spectrochimica Acta Part B: Atomic SpectroscopySpectrochimica Acta Part B: Atomic Spectroscopy05848547"Depth-profile analysis of thermoelectric layers on Si wafers by pulsed r.f. glow discharge time-of-flight mass spectrometry" . Search in Google Scholar

3 , 2010, no. 3, vol. 80, p. 22310.1016/j.mimet.2009.12.010Peterson Greg, Bai Jianfa, Nagaraja T.G., Narayanan Sanjeev. Journal of Microbiological MethodsJ Microbiol Meths01677012"Diagnostic microarray for human and animal bacterial diseases and their virulence and antimicrobial resistance genes" . Search in Google Scholar

4 , 2009, no. 3-4, vol. 165, p. 26510.1007/s00604-008-0131-1Dargel Rainer, Heinemeyer Frank, Köntges Marc, Vogt Jürgen, Vogt Carla. Microchimica ActaMicrochim Acta14365073"Detection of trace impurities in Cu(In, Ga)Se2 thin film solar cells by laser ablation ICP-MS" . Search in Google Scholar

5 , 2007, no. s1, vol. 4, p. 25910.1002/ppap.200730713Micheli Victor, Laidani Nadhira, Bartali Ruben, Gottardi Gloria, Anderle Mariano. Plasma Processes and PolymersPlasma Process Polym16128869"Interface Effects Study in Hard–Soft Carbon Multilayered Films by AES Depth Profiling" . Search in Google Scholar

6 , 2003, no. 7, vol. 35, p. 55610.1002/sia.1574Hofmann Siegfried. Surface and Interface AnalysisSurf Interface Anal10969918"Advances in sputter depth profiling using AES" . Search in Google Scholar

7 , 2003, no. 1-2, vol. 444, p. 12010.1016/S0040-6090(03)01112-XWang J.Y., Hofmann S., Zalar A., Mittemeijer E.J. Thin Solid FilmsThis Solid Films00406090"Quantitative evaluation of sputtering induced surface roughness in depth profiling of polycrystalline multilayers using Auger electron spectroscopy" . Search in Google Scholar

8 , 2001, no. , vol. 398-399, p. 33610.1016/S0040-6090(01)01340-2Hofmann Siegfried. Thin Solid FilmsThis Solid Films00406090"Profile reconstruction in sputter depth profiling" . Search in Google Scholar

9 , 1999, no. 9, vol. 27, p. 82510.1002/(SICI)1096-9918(199909)27:9<825::AID-SIA638>3.0.CO;2-DHofmann Siegfried. Surface and Interface AnalysisSurf Interface Anal10969918"From depth resolution to depth resolution function: refinement of the concept for delta layers, single layers and multilayers" . Search in Google Scholar

10 , 1998, no. 7, vol. 61, p. 82710.1088/0034-4885/61/7/002Hofmann S. Reports on Progress in PhysicsRep Prog Phys13616633"None" . Search in Google Scholar

11 , 1993, no. 13, vol. 20, p. 106110.1002/sia.740201306Fujita D., Kim K. J., Kajiwara K., Yoshihara K., Moon D. W. Surface and Interface AnalysisSurf Interface Anal10969918"GaAs/AlAs superlattice as a proposed new reference material for sputter depth profiling" . Search in Google Scholar

12 , 1991, no. 1, vol. 36, p. 3510.1016/0079-6816(91)90013-THofmann S. Progress in Surface ScienceProg Surf Sci00796816"Compositional depth profiling by sputtering" . Search in Google Scholar

13 , 1989, no. 6-7, vol. 14, p. 40710.1002/sia.740140619Seah M. P. Surface and Interface AnalysisSurf Interface Anal10969918"VAMAS surface chemical analysis technical working party: An update for 1988" . Search in Google Scholar

14 , 1988, no. 1-2, vol. 11, p. 10310.1002/sia.740110113Powell C. J. Surface and Interface AnalysisSurf Interface Anal10969918"The development of standards for surface analysis" . Search in Google Scholar

15 , 1988, no. 5, vol. 332, p. 42110.1007/BF00499263Fischmeister H. F. Fresenius Zeitschrift für Analytische ChemieFresenius Zeitschrift fur Analytische Chemie16182650"Applications of surface analysis in materials science and technology" . Search in Google Scholar

16 , 1986, no. 5, vol. 323, p. 42110.1007/BF00470757Grasserbauer M., Stingeder G., Pötzl H., Guerrero E. Fresenius Zeitschrift für Analytische ChemieFresenius Zeitschrift fur Analytische Chemie16182650"Analytical science for the development of microelectronic devices" . Search in Google Scholar

17 , 1980, no. 2, vol. 16, p. 18710.1080/05704928008081712Chaudhar Sunetra N. Kar, Cheng K. L. Applied Spectroscopy ReviewsAppl Sp Rev1520569X"Recent Study of Solid Surfaces by Photoelectron Spectroscopy" . Search in Google Scholar

Online erschienen: 2009-1-1
Erschienen im Druck: 1979-1-1

© 2013 Walter de Gruyter GmbH, Berlin/Boston

Downloaded on 30.9.2023 from
Scroll to top button