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Abstract
A new graphical approach for analysis of measurement system comparison studies is proposed. Unlike the established linear regression and Bland-Altman analysis, it does not depend on the assumption of a linear relationship. We review the established analysis approaches and propose a difference plot with non-parametric regression as an adequate tool to describe the relationship between two measurement systems. Along with pre-defined level-dependent acceptance limits, this approach may provide evidence for metrological equivalence between two measurement systems. Several data examples are given to illustrate this approach.
Clin Chem Lab Med 2008;46:1211–9.
Keywords: Bland-Altman analysis; local regression; measurement system comparison; method comparison studies; metrological equivalence; substantial equivalence
Received: 2008-3-20
Accepted: 2008-6-9
Published Online: 2008-08-06
Published in Print: 2008-09-01
©2008 by Walter de Gruyter Berlin New York
