Skip to content
Licensed Unlicensed Requires Authentication Published by De Gruyter April 18, 2016

A holographic method for optimisation of laser-based production processes

Krste Pangovski, Martin Sparkes and William O’Neill

Abstract

A digital holographic system is used to image the plume dynamics of a train of picosecond laser pulses interacting with titanium, aluminium, copper and brass. The recorded process dynamics are used to propose two optimisation strategies: first, by observing the time at which the plume fully dissipates and, second, through calculation of the minimum beam displacement required to maximise energy delivery to the sample by avoiding the plume. The proposed approach could further be applied in real industrial process design, allowing laser users to formulate a processing strategy based on process dynamics rather than lengthy post-process evaluation of a sample.

Acknowledgments

This work was carried out under EPSRC grant number EP/K030884/1, as part of the EPSRC Centre for Innovative Manufacturing in Laser-based Production Processes. The authors would like to extend their gratitude to their colleagues at Applied Laser Engineering Ltd, UK, for their kind support of this work.

References

[1] G. Taylor, Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences, 201, 159–174 (1950).Search in Google Scholar

[2] G. Taylor, Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences, 201, 175–186 (1950).Search in Google Scholar

[3] O. Yavas, E. L. Maddocks, M. R. Papantonakis and R. F. Haglund Jr., Appl. Surf. Sci. 127, 26–32 (1998).10.1016/S0169-4332(98)00106-8Search in Google Scholar

[4] S. S. Mao, X. Mao, R. Greif and R. E. Russo, J. Appl. Phys. 89, 4096 (2001).10.1063/1.1351870Search in Google Scholar

[5] S.-B. Wen, X. Mao, R. Greif and R. E. Russo, J. Appl. Phys. 101, 023115 (2007).10.1063/1.2431085Search in Google Scholar

[6] N. M. Bulgakova and A.V. Bulgakov, Appl. Phys. A Mater. Sci. Process. 73, 199–208 (2001).10.1007/s003390000686Search in Google Scholar

[7] J. H. Yoo, S. H. Jeong, X. L. Mao, R. Greif and R. E. Russo, Appl. Phys. Lett. 76, 783 (2000).10.1063/1.125894Search in Google Scholar

[8] K. Pangovski, M. Sparkes, A. Cockburn, W. O’Neill and D. Richardson, IEEE J. Sel. Top. Quantum Electron. 20, 51–63 (2014).10.1109/JSTQE.2014.2302441Search in Google Scholar

[9] J. W. Goodman and R. W. Lawrence, Appl. Phys. Lett. 77, 11 (1967).Search in Google Scholar

[10] E. N. Leith and J. Upatnieks, J. Opt. Soc. Am. 52, 1123–1130 (1962).10.1364/JOSA.52.001123Search in Google Scholar

[11] S. Amoruso, R. Bruzzese, N. Spinell and R. Velotta, J. Phys. B: At. Mol. Opt. Phys. 32, R131–163 (1999).10.1088/0953-4075/32/14/201Search in Google Scholar

[12] U. Schnars and W. P. O. Jüptner, Meas. Sci. Technol. 13, 13 (2002).10.1088/0957-0233/13/1/302Search in Google Scholar

[13] E. Amer, P. Gren and M. Sjödahl, J. Phys. D: Appl. Phys. 41, 215502 (2008).10.1088/0022-3727/41/21/215502Search in Google Scholar

[14] E. Amer, P. Gren and M. Sjödahl, Opt. Lasers Eng. 47, 793–799 (2009).10.1016/j.optlaseng.2009.02.005Search in Google Scholar

[15] A. G. Demir, K. Pangovski, W. O’Neill and B. Previtali, J. Phys. D: Appl. Phys. 48, 235202 (2015).10.1088/0022-3727/48/23/235202Search in Google Scholar

[16] H. O. Saldner, N. E. Molin and K. A. Stetson, Appl. Opt. 35, 332–336 (1996).10.1364/AO.35.000332Search in Google Scholar

[17] K. A. Stetson and W. R. Brohinsky, Appl. Opt. 24, 3631 (1985).10.1364/AO.24.003631Search in Google Scholar

[18] G. H. Kaufmann and G. E. Galizzi, Appl. Opt. 41, 7254–7263 (2002).10.1364/AO.41.007254Search in Google Scholar

[19] Q. Kemao. Opt. Lasers Eng. 45, 304–317 (2007).10.1016/j.optlaseng.2005.10.012Search in Google Scholar

[20] J. C. Estrada, M. Servin and J. Vargas, Opt. Lasers Eng. 50, 1026–1029 (2012).10.1016/j.optlaseng.2012.01.008Search in Google Scholar

[21] M. A. Herraez, M. A. Gdeisat, D. R. Burton and M. J. Lalor, Appl. Opt. 41, 7445–7455 (2002).10.1364/AO.41.007445Search in Google Scholar

[22] M. A. Herraez, D. R. Burton, M. J. Lalor and M. A. Gdeisat, Appl. Opt. 41, 7437–7444 (2002).10.1364/AO.41.007437Search in Google Scholar

[23] M. A. Herráez, M. A. Gdeisat, D. R Burton and M. J. Lalor, Appl. Opt. 41, 7445–7455 (2002).10.1364/AO.41.007445Search in Google Scholar

[24] U. Schnars and W. Juptner, Meas. Sci. Technol. 13, 3228–3235 (2002).Search in Google Scholar

[25] P. Gren, S. Schedin and X. Li, Appl. Opt. 37, 834–840 (1998).10.1364/AO.37.000834Search in Google Scholar

[26] E. Amer, P. Gren, A. F. H. Kaplan and M. Sjödahl, Appl. Surf. Sci. 255, 8917–8925 (2009).10.1016/j.apsusc.2009.06.095Search in Google Scholar

[27] S. Grilli, P. Ferraro, S. De Nicola, A. Finizio, G. Pierattini and R. Meucci, Opt. Express 9, 294–302 (2001).10.1364/OE.9.000294Search in Google Scholar

[28] N. Verrier and M. Atlan, Appl. Opt. 50, H136–H146 (2011).10.1364/AO.50.00H136Search in Google Scholar

[29] J. Li, P. Tankam, Z. Peng and P. Picart, Opt. Lett. 34, 572–574 (2009).10.1364/OL.34.000572Search in Google Scholar

[30] P. Picart, P. Tankam, D. Mounier, Z. Peng and J. Li, Opt. Lett. 17, 9145–9156 (2009).Search in Google Scholar

[31] L. I. Bluestein, IEEE Trans. Audio Electroacoustics 18, 451–455 (1970).10.1109/TAU.1970.1162132Search in Google Scholar

[32] H. R. Griem. ‘Plasma Spectroscopy’, (McGraw-Hill, New York, 1964).Search in Google Scholar

[33] D. Breitling, H. Schittenhelm, P. Berger, F. Dausinger and H. Hügel, Appl. Phys. A: Mater. Sci. Process. 69, S505–S508 (1999).10.1007/s003390051454Search in Google Scholar

[34] S. Sharma, G. Sheoran and C. Shakher, Appl. Opt. 51, 3228 (2012).10.1364/AO.51.003228Search in Google Scholar

[35] M. Stafe, C. Negutu and I. M. Popescu, Shock Waves 14, 1–4 (2005).10.1007/s00193-005-0253-xSearch in Google Scholar

[36] T. W. Murray and J. W. Wagner, J. Appl. Phys. 85, 2031 (1999).10.1063/1.369498Search in Google Scholar

[37] J. D. Huba, NRL PLASMA FORMULARY Supported by The Office of Naval Research. Office of Naval Research, pages 1–71, 2009.10.21236/ADA499299Search in Google Scholar

Received: 2015-12-1
Accepted: 2016-3-8
Published Online: 2016-4-18
Published in Print: 2016-4-1

©2016 THOSS Media & De Gruyter