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Development of a metrology technique suitable for in situ measurement and corrective manufacturing of freeform optics

Dali Ramu Burada, Kamal K. Pant, Vinod Mishra, Mohamed Bichra, Gufran Sayeed Khan ORCID logo, Stefan Sinzinger and Chandra Shakher

Abstract

The applications of freeform optical surfaces in modern optical systems are providing unique solutions over rotationally symmetric surfaces. These surfaces offer higher degrees of freedom to the designer to enhance the high-end performance of the optical system. The precise metrology of freeform optics is one of the major bottlenecks for its use in imaging applications. Modern optical fabrication methods (i.e. fast or slow tool servo configuration) are, in principle, capable to meet the challenges to generate complex freeform surfaces if supported by precise metrology feedback for error compensation. In the present work, we have developed a Shack-Hartmann sensor-based metrology technique that can be used for quantitative in situ measurement of freeform optics. The sensor head is used to measure freeform optics in the reflection mode by following the CNC tool path in the offline mode. The measurements are used as feedback for corrective machining. Quantitative analysis is also performed to estimate the error budget of the metrology system. Further, the proposed in situ metrology scheme is validated by measuring freeform surface using a coherence correlation interferometric optical profiler.

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Received: 2018-10-01
Accepted: 2019-04-23
Published Online: 2019-05-23
Published in Print: 2019-06-26

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