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Licensed Unlicensed Requires Authentication Published by De Gruyter May 8, 2021

Meßtechnische Eigenschaften von Dünnfilm-Halbleiter-Dehnungsmeßstreifen / Characteristics of thin film semiconductor strain gages / Les caracteristiques de jauges a couche mince semi-conductrice

Ergänzte Fassung des SESA-Vortrags [1] auf dem Second International Congress on Experimental Mechanics, Washington (1965)

Osamu Watanabe and Ken Shioda
From the journal Materials Testing
Published Online: 2021-05-08
Published in Print: 1967-06-01

© 2021 by Walter de Gruyter Berlin/Boston

Downloaded on 10.12.2022 from https://www.degruyter.com/document/doi/10.1515/mt-1967-090603/html
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