Accessible Requires Authentication Published by De Gruyter May 27, 2021

In-situ lift-out von TEM - Proben durch Mikromanipulation in einem Rasterelektronenmikroskop / In-Situ Lift-Out of TEM - Samples by Micro Manipulation in a Scanning Electron Microscope

C. Burkhardt and W. Nisch
From the journal Practical Metallography