Burkhardt, C. and Nisch, W.. "In-situ lift-out von TEM - Proben durch Mikromanipulation in einem Rasterelektronenmikroskop / In-Situ Lift-Out of TEM - Samples by Micro Manipulation in a Scanning Electron Microscope"
Practical Metallography, vol. 41, no. 4, 2004, pp. 190-198.
https://doi.org/10.1515/pm-2004-410407
Burkhardt, C. & Nisch, W. (2004). In-situ lift-out von TEM - Proben durch Mikromanipulation in einem Rasterelektronenmikroskop / In-Situ Lift-Out of TEM - Samples by Micro Manipulation in a Scanning Electron Microscope.
Practical Metallography,
41(4), 190-198.
https://doi.org/10.1515/pm-2004-410407
Burkhardt, C. and Nisch, W. (2004) In-situ lift-out von TEM - Proben durch Mikromanipulation in einem Rasterelektronenmikroskop / In-Situ Lift-Out of TEM - Samples by Micro Manipulation in a Scanning Electron Microscope. Practical Metallography, Vol. 41 (Issue 4), pp. 190-198.
https://doi.org/10.1515/pm-2004-410407
Burkhardt, C. and Nisch, W.. "In-situ lift-out von TEM - Proben durch Mikromanipulation in einem Rasterelektronenmikroskop / In-Situ Lift-Out of TEM - Samples by Micro Manipulation in a Scanning Electron Microscope"
Practical Metallography 41, no. 4 (2004): 190-198.
https://doi.org/10.1515/pm-2004-410407
Burkhardt C, Nisch W. In-situ lift-out von TEM - Proben durch Mikromanipulation in einem Rasterelektronenmikroskop / In-Situ Lift-Out of TEM - Samples by Micro Manipulation in a Scanning Electron Microscope.
Practical Metallography. 2004;41(4): 190-198.
https://doi.org/10.1515/pm-2004-410407
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