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In-situ lift-out von TEM - Proben durch Mikromanipulation in einem Rasterelektronenmikroskop / In-Situ Lift-Out of TEM - Samples by Micro Manipulation in a Scanning Electron Microscope

  • C. Burkhardt and W. Nisch
From the journal Practical Metallography
Online erschienen: 2021-05-27
Erschienen im Druck: 2004-04-01

© 2021 by Walter de Gruyter Berlin/Boston

Downloaded on 28.3.2024 from https://www.degruyter.com/document/doi/10.1515/pm-2004-410407/pdf
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