Würth, Christian, Geißler, Daniel and Resch-Genger, Ute. "Quantification of Anisotropy-Related Uncertainties in Relative Photoluminescence Quantum Yield Measurements of Nanomaterials – Semiconductor Quantum Dots and Rods"
Zeitschrift für Physikalische Chemie, vol. 229, no. 1-2, 2015, pp. 153-165.
https://doi.org/10.1515/zpch-2014-0626Würth, C., Geißler, D. & Resch-Genger, U. (2015). Quantification of Anisotropy-Related Uncertainties in Relative Photoluminescence Quantum Yield Measurements of Nanomaterials – Semiconductor Quantum Dots and Rods.
Zeitschrift für Physikalische Chemie,
229(1-2), 153-165.
https://doi.org/10.1515/zpch-2014-0626Würth, C., Geißler, D. and Resch-Genger, U. (2015) Quantification of Anisotropy-Related Uncertainties in Relative Photoluminescence Quantum Yield Measurements of Nanomaterials – Semiconductor Quantum Dots and Rods. Zeitschrift für Physikalische Chemie, Vol. 229 (Issue 1-2), pp. 153-165.
https://doi.org/10.1515/zpch-2014-0626Würth, Christian, Geißler, Daniel and Resch-Genger, Ute. "Quantification of Anisotropy-Related Uncertainties in Relative Photoluminescence Quantum Yield Measurements of Nanomaterials – Semiconductor Quantum Dots and Rods"
Zeitschrift für Physikalische Chemie 229, no. 1-2 (2015): 153-165.
https://doi.org/10.1515/zpch-2014-0626Würth C, Geißler D, Resch-Genger U. Quantification of Anisotropy-Related Uncertainties in Relative Photoluminescence Quantum Yield Measurements of Nanomaterials – Semiconductor Quantum Dots and Rods.
Zeitschrift für Physikalische Chemie. 2015;229(1-2): 153-165.
https://doi.org/10.1515/zpch-2014-0626