Skip to content
Licensed Unlicensed Requires Authentication Published by De Gruyter (O) July 28, 2010

Characterization of interface structures in nanocrystalline germanium by means of high-resolution electron microscopy and molecular dynamics simulations

Abstract

The atomic structure of nanocrystalline particles formed by vapor deposition and subsequent annealing of amorphous thin films of germanium was studied by high resolution electron microscopy (HREM). The HREM images revealed a strongly varied multiply twinned structure. In some regions of adjacent twins contrast features were detected which were caused by an overlapping of twin lamellae. It will be shown by HREM contrast simulations that these interface types can be described by Σ = 3n boundaries. The influence of lattice relaxations is taken into consideration by molecular dynamics simulations of the structure models.

Published Online: 2010-7-28
Published in Print: 1996-3-1

© 2015 Oldenbourg Wissenschaftsverlag GmbH, Rosenheimer Str. 145, 81671 München

Downloaded on 3.12.2022 from frontend.live.degruyter.dgbricks.com/document/doi/10.1524/zkri.1996.211.3.147/html
Scroll Up Arrow