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Publicly Available Published by De Gruyter (O) April 19, 2010

Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope

  • Peter Moeck and Sergei Rouvimov

Abstract

The foundations of precession electron diffraction in a transmission electron microscope are outlined. A brief illustration of the fact that laboratory-based powder X-ray diffraction fingerprinting is not feasible for nanocrystals is given. A procedure for structural fingerprinting of nanocrystals on the basis of structural data that can be extracted from precession electron diffraction spot patterns is proposed.


* Correspondence address: Portland State University, Department of Physics, P.O. Box 751, OR 97207-0 Portland, Oregon, U.S.A.,

Published Online: 2010-04-19
Published in Print: 2010-03

© by Oldenbourg Wissenschaftsverlag, München, Germany

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