Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope

Peter Moeck; Sergei Rouvimov

doi:10.1524/zkri.2010.1162

Publicly Available Published by De Gruyter (O) April 19, 2010

Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope

Peter Moeck and Sergei Rouvimov

From the journal Zeitschrift für Kristallographie

https://doi.org/10.1524/zkri.2010.1162

Abstract

The foundations of precession electron diffraction in a transmission electron microscope are outlined. A brief illustration of the fact that laboratory-based powder X-ray diffraction fingerprinting is not feasible for nanocrystals is given. A procedure for structural fingerprinting of nanocrystals on the basis of structural data that can be extracted from precession electron diffraction spot patterns is proposed.

Keywords: Precession electron diffraction; Structural fingerprinting

^* Correspondence address: Portland State University, Department of Physics, P.O. Box 751, OR 97207-0 Portland, Oregon, U.S.A., pmoeck@pdx.edu

Published Online: 2010-04-19

Published in Print: 2010-03

Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope

Abstract

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