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Licensed Unlicensed Requires Authentication Published by De Gruyter June 11, 2013

A transmission electron microscopy procedure for in-situ straining of miniature pseudoelastic NiTi specimens

  • J. Olbricht , M. F.-X. Wagner , A. Condó , A. Dlouhy , Ch. Großmann , A. Kröger , Ch. Somsen and G. Eggeler


The in-situ transmission electron microscopy technique allows direct observations of formation and growth of stress-induced martensite in pseudoelastic NiTi shape memory alloys. The present paper reports on the development of a miniature test procedure for in-situ straining experiments with specimens taken from small components. The deformation of an ultra-fine grained NiTi specimen is characterised by transmission electron microscopy (at early loading stages) and by optical microscopy (at larger strains). A complementary finite element analysis of the complex strain state in the specimen rationalises why the stress-induced martensitic transformation first occurs in the thin foil region of the specimen before spreading towards the outer rim of the specimen.

* Correspondence address, Dipl.-Ing. Jürgen Olbricht Institut für Werkstoffe, Ruhr-Universität Bochum 44780 Bochum, Germany Tel.: +49 234 32 28982 Fax: +49 234 32 14235 E-mail:


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Received: 2008-3-31
Accepted: 2008-6-5
Published Online: 2013-06-11
Published in Print: 2008-10-01

© 2008, Carl Hanser Verlag, München

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