Accessible Unlicensed Requires Authentication Published by De Gruyter June 11, 2013

Synchrotron X-ray line-profile analysis experiments for the in-situ microstructural characterisation of SPD nanometals during tensile deformation

Michael B. Kerber, Erhard Schafler, Arkadiusz K. Wieczorek, Gabor Ribarik, Sigrid Bernstorff, Tamas Ungar and Michael J. Zehetbauer

Abstract

There is a great interest in the understanding of mechanical properties of nanocrystalline materials, especially of those processed by severe plastic deformation, since those exhibit both high strength and considerable ductility. A special setup for X-ray line profile analysis was developed for monitoring the microstructural evolution of in-situ tensile tests of high pressure torsion deformed samples. A comprehensive evaluation procedure is presented which allows the determination of several physical microstructural parameters. This includes a careful estimation of the error of the evaluation procedure. As an example, nickel shows a slight decrease of the size of the coherently scattering domains while the dislocation density tends to increase. The dislocation arrangement exhibits strain-field-screening of neighboring dislocations and an equal amount of screw and edge dislocations.


* Correspondence address, Michael Kerber Physics of Nanostructured Materials Faculty of Physics, University of Vienna Boltzmanngasse 5, A-1090 Wien, Austria Tel.: +43 1 4 277 51445 Fax: +43 1 4 277 51440 E-mail:

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Received: 2008-9-12
Accepted: 2009-4-1
Published Online: 2013-06-11
Published in Print: 2009-06-01

© 2009, Carl Hanser Verlag, München