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Licensed Unlicensed Requires Authentication Published by De Gruyter May 31, 2013

Synchrotron and neutron laminography for three-dimensional imaging of devices and flat material specimens

  • Lukas Helfen , Thilo F. Morgeneyer , Feng Xu , Mark N. Mavrogordato , Ian Sinclair , Burkhard Schillinger and Tilo Baumbach

Abstract

Computed laminography has been introduced to synchrotron and neutron imaging set-ups to complement computed tomography for three-dimensional imaging of laterally extended (i. e. plate-like) specimens. The wide application field of computed laminography due to different contrast modes (X-ray or neutron absorption and X-ray phase contrast) and spatial resolutions ranging from some 100 down to approximately 0.5 μm is demonstrated. Selected examples from device inspection and from materials science are reported. They outline the interest of the method for non-destructive and in-situ measurements of regions of interest in large planar specimens where engineering-relevant boundary conditions have to be met. With a materials science background, the in-situ investigation of crack propagation in aluminium sheets and carbon-fibre composite panels under mechanical loading is reported.


* Correspondence address Dr. Lukas Helfen, ISS/ANKA, Karlsruhe Institute of Technology, Herrmann-von-Helmholtz-Platz 1D-76344 Eggenstein-Leopoldshafen, Germany, Tel.: +33 476 88 25 58, Fax: +33 476 88 22 52, E-mail:

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Received: 2011-8-1
Accepted: 2011-11-10
Published Online: 2013-05-31
Published in Print: 2012-02-01

© 2012, Carl Hanser Verlag, München

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