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Licensed Unlicensed Requires Authentication Published by De Gruyter June 11, 2013

Orientation and Phase Analysis of Nanoscale Grains Using Transmission Electron Microscopy

Orientierungs- und Phasenanalyse nanoskaliger Körner mittels Transmissionselektronenmikroskopie
M. Seyring , X. Song and M. Rettenmayr
From the journal Practical Metallography

Abstract

The nanostructuring of materials is a process which enables their properties to be drastically changed as compared to their coarse crystalline condition. For example, peculiar features were achieved, e.g. extremely high yield and ultimate strengths. The structure of such nanoscale materials has not been characterized yet in detail as compared to materials of a coarser crystalline structure because an appropriate analytical technique did not exist. Nano beam diffraction (NBD) by transmission electron microscopy (TEM) makes possible a local resolution up to 1 nm and, thus, a diffraction analysis of individual nanograins. A recently developed method based on NBD allows determining crystallographic orientation relationships and analyzing the phases of individual nanograins. This article below sets forth the analytical possibilities of this method by way of a complete evidence of twin and small-angle grain boundaries in nanocrystalline copper and a phase identification of precipitates in an AlMg5Si2 alloy.

Kurzfassung

Durch das Nanostrukturieren von Materialien können deren Eigenschaften gegenüber dem grobkristallinen Zustand drastisch verändert werden. Es sind bspw. besondere Eigenschaften wie extrem hohe Streckgrenzen und Bruchfestigkeiten erreicht worden. Im Vergleich zu gröber kristallinen Materialien wurde das Gefüge solcher nanoskaligen Materialien bisher nicht detailliert charakterisiert, da keine geeignete Analysemethode existierte. Nanostrahlelektronenbeugung (nano beam diffraction, NBD) im Transmissionselektronenmikroskop (TEM) erlaubt eine Ortsauflösung von bis zu 1 nm und damit eine Beugungsanalyse einzelner Nanokörner. Eine jüngst entwickelte Methode, beruhend auf NBD, ermöglicht die Bestimmung kristallographischer Orientierungsbeziehungen und die Phasenanalyse einzelner Nanokörner. Die analytischen Möglichkeiten dieser Methode werden hier anhand eines lückenlosen Nachweises von Zwillings- und Kleinwinkelkorngrenzen in nanokristallinem Kupfer und der Phasenidentifikation von Ausscheidungen in einer AlMg5Si2-Legierung demonstriert.


Translation: J. Fritsche

Markus Rettenmayr studied Physical Metallurgy at Stuttgart University where he also completed his PhD thesis. A stay in the US at Rensselaer Polytechnic Institute was followed by research and teaching at Darmstadt University of Technology. In 2004 he was appointed professor at Friedrich-Schiller-University in Jena.

Martin Seyring studied materials science at Friedrich-Schiller-University Jena between 2002 and 2007 and graduated with an engineer's degree. He is working on the characterization of nanocrystalline materials by transmission electron microscopy in cooperation with Beijing University of Technology.


References / Literatur

[1] Dao, M.; Lu, L.; Asaro, R.J.; De Hosson, J. T. M.; Ma, E.: Acta Mater. 55 (2007) 12) 40414065.10.1016/j.actamat.2007.01.038Search in Google Scholar

[2] Van Swygenhoven, H.: Science296 (2002) 5565) 6667.Search in Google Scholar

[3] Humphreys, F.J.: Scr. Mater.51 (2004) 8) 771776.Search in Google Scholar

[4] Cowley, J. M.: Micron35 (2004) 5) 345360.Search in Google Scholar

[5] Zaefferer, S.: J. Appl. Crystallogr.33 (2000) 1025.10.1107/S0021889899010894Search in Google Scholar

[6] Rauch, E. F.; Dupuy, L.: Arch. Metall. Mater.50 (2005) 1) 8799.Search in Google Scholar

[7] Dingley, D.J.: Microchim. Acta155 (2006) (1–2) 1929.10.1007/s00604-006-0502-4Search in Google Scholar

[8] Seyring, M.; Song, X. Y.; Rettenmayr, M.: ACS Nano54, 25802586.Search in Google Scholar

[9] Lu, K.; Lu, L.; Suresh, S.: Science324 (2009) 5925) 349352.10.1145/1375783.1375819Search in Google Scholar

[10] Randle, V.: The measurement of grain boundary geometryInstitute of Physics Publ., Bristol, 1993, XI, 169 S10.1016/B0-08-043152-6/00643-4Search in Google Scholar

[11] Khorashadizadeh, A.; Raabe, D.; Zaefferer, S.; Rohrer, G. S.; Rollett, A. D.; Winning, M.: Adv. Eng. Mater.13 (2011) 4) 237244.Search in Google Scholar

[12] Liu, H.; Schmidt, S.; Poulsen, H.; Godfrey, A.; Liu, Z.; Sharon, J.; Huang, X.: Science. 332 (2011) 6031) 833834.10.1145/1375783.1375819Search in Google Scholar

Received: 2012-5-25
Accepted: 2012-7-13
Published Online: 2013-06-11
Published in Print: 2012-10-01

© 2012, Carl Hanser Verlag, München

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