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Licensed Unlicensed Requires Authentication Published by De Gruyter June 11, 2013

Grain Size Measurements Using Circular or Rectangular Test Grids

Korngrößenmessung mit runden oder eckigen Prüfrastern
G.F. Vander Voort
From the journal Practical Metallography

Abstract

Experiments were conducted to determine the influence of the number of grains counted using the Jeffries planimetric procedure of ASTM E 112 with a single test circle compared to the number counted using rectangles as suggested by Saltykov. Both planimetric methods produced similar estimates of the ASTM grain size number when the counts per field placement were high. The Saltykov rectangle method is a viable test method and produced good data down to low count numbers. Bias was not observed at low counts, only data scatter. The intercept count method, using only a single test circle per field, yielded slightly higher estimates of the ASTM grain size number, but the difference was relatively insignificant.

Kurzfassung

Es wurden Versuche durchgeführt, um die Anzahl der ausgezählten Körner anhand des planimetrischen Verfahrens nach Jeffries für ASTM E 112 mit einem einzigen Prüfkreis mit der Anzahl wie sie aus dem von Saltykov vorgeschlagenen Verfahren mit Vierecken resultiert, zu vergleichen und zu sehen, wie sich diese Anzahl auf die Korngröße auswirkt. Beide planimetrischen Methoden ergaben ähnliche Schätzwerte für die ASTM-Korngrößenzahl bei hohen Counts pro Platzierung im Feld. Die Methode nach Saltykov mit viereckigem Raster ist ein praktikables Prüfverfahren und erbrachte bis hin zu niedrigen Counts gute Messwerte. Bei niedrigen Counts konnten keine Biasfehler gefunden werden. Lediglich Datenstreuung trat auf. Das Intercept-Zählverfahren mit lediglich einem Prüfkreis pro Feld ergab geringfügig höhere Schätzwerte für die ASTM-Korngrößenzahl, der Unterschied war jedoch relativ unbedeutend.


Übersetzung: E. Engert

George F. Vander Voort Consultant, Struers Inc. and president of Vander Voort Consulting LLC, is a graduate of Drexel University and Lehigh University. A past president of the International Metallographic Society and past chairman of ASTM Committee E-4 on Metallography, George has six patents, over 330 publications and has given 387 lectures in 39 countries. He is a member of the editorial board of Praktische Metallographie. George is a fellow of ASMI, ASTM and the IFHTSE, and is an honorary member of the Polish Society for Stereology.


References/Literatur

[1] Vander Voort, G.F.: Grain Size Measurement, Practical Applications of Quantitative Metallography, ASTM STP 839, ASTM, Philadelphia, 1884, 85131.10.1520/STP30216SSearch in Google Scholar

[2] Vander Voort, G.F.: Metallography: Principles and Practice, McGraw-Hill Book Co., NY, 1984; ASM International, Materials Park, OH, 1999, 219223 and 435472.Search in Google Scholar

[3] Vander Voort, G.F.: Committee E-4 and Grain Size Measurements: 75 Years of Progress, Standardization News, Vol. 19, May 1991, 4247.Search in Google Scholar

[4] Vander Voort, G.F.: Examination of Some Grain Size Measurement Problems, Metallography: Past, Present and Future, ASTM STP 1165, ASTM, Philadelphia, 1993, 266294.10.1520/STP25108SSearch in Google Scholar

[5] Vander Voort, G.F., Friel, J.J.: Image Analyis Measurements of Duplex Grain Structures, Materials Characterization, Vol. 29, No. 3, October 1992, 293312.10.1016/1044-5803(92)90101-MSearch in Google Scholar

[6] ASTM E 2–62 (reapproved 1974), “Standard Methods of Preparation of Metals and Alloys.”Search in Google Scholar

[7] Jeffries, Z., KlineA.H., Zimmer, E.B.: Trans. AIME, Vol. 54, 1916, 594607.Search in Google Scholar

[8] Jeffries, Z.: Trans. of the Faraday Society, Vol. 12, 1916, pp. 4056.10.1039/tf9171200040Search in Google Scholar

[9] Sauveur, A.: Trans. AIME, Vol. 22, 1894, 546557.Search in Google Scholar

[10] Heyn, E.: The Metallographist, Vol. 5, 1903, 3964.10.1093/mnras/64.1.39Search in Google Scholar

[11] ASTM E 91–51T, “Method for Estimating the Average Grain Size of Non-Ferrous Metals Other than Copper and Their Alloys.”Search in Google Scholar

[12] Vander Voort, G.F.: Precision and Reproducibility of Quantitative Measurements, Quantitative Microscopy and Image Analysis, ASM International, Materials Park, OH, 1994, 2134.Search in Google Scholar

[13] Saltykov, S.A.: Stereometricheskaya Metallografiya (Stereometric Metallography), 2nd revised and supplemented edition, Metallurgizdat, Moscow, 1958, 444 pgs.Search in Google Scholar

Received: 2012-9-17
Accepted: 2012-9-21
Published Online: 2013-06-11
Published in Print: 2013-01-01

© 2013, Carl Hanser Verlag, München

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