Abstract
A systematic search for metal– indium systems which show a potentially high remelting temperature in diffusion-soldered bonds was done by investigation of phase formation and reaction kinetics in M– In systems (M = Pt, Pd, Mn). Phase equilibration experiments M–In (M = Pd, Mn) were done with powder samples prepared from pure elements, heated in evacuated silica capsules between 200 and 700 °C for 15 min to 570 h, and studied by X-ray diffraction analysis. Diffusion couples M/In (M = Pt, Pd, Mn) were prepared from the foils or wires of pure elements and heated in a bonding furnace or in evacuated silica tubes at 250 – 700 °C for 30 min to 96 h. The couples were cross-sectioned and studied by scanning electron microscopy with energy-dispersive X-ray analysis. The rates of M– In reactions can be semiquantitatively ordered in the sequence Pt > Pd≫Mn ( – In). The activation energy of the well-defined reaction of Mn– In powder samples was calculated to be 56 ± 10 kJ/mol. The activation energies calculated from the layer growth in diffusion couples show a large uncertainty, they are 39 kJ/mol (Pt/In), 23 kJ/mol (Pd/In) and 41 kJ/mol (Mn/In). Pt – In and Pd– In are very promising candidates for diffusion soldering of high-temperature stable bonds.
This study was supported by the German Research Council (DFG) under Grant No. Schm 588/20.
References
50Zwi Zwicker, U.: Z. Metallkd. 41 (1950) 399.Search in Google Scholar
62Aoy Aoyagi, K.; Sugihara, M.: J. Phys. Soc. Japan 17 (1962) 1072.10.1143/JPSJ.17.1072Search in Google Scholar
68Kop Kopp, W.U.; Romer, O.; Wachtel, E.: Z. Metallkd. 59 (1968) 917.Search in Google Scholar
72Jai Jain, K.C.; Bhan, S.: Trans. Indian Inst. Met. 25 (1972) 100.Search in Google Scholar
76Gue Guex, P.; Feschotte, P.: J. Less-Common. Metals 46 (1976) 101.10.1016/0022-5088(76)90183-1Search in Google Scholar
78Bro Browne, J.D.; Hance, N.J.; Johnston, G.B.; Sampson, C.F.: Phys. Stat. Sol. 49 (1978) 177.10.1002/pssa.2210490265Search in Google Scholar
87All Allen, L.H.; Hung, L.S.; Kavanagh, K.L.; Phillips, J.R.; Yu, A.J.; Mayer, J.W.: Appl. Phys. Lett. 51 (1987) 326.10.1063/1.98429Search in Google Scholar
88Jan Jandova, J.; Jakes, D.: Kovove Mat. 26 (1988) 38.Search in Google Scholar
88Sch Schmid, E.E.; Carle, V.: Prakt. Met. 25 (1988) 340.Search in Google Scholar
88San Sands, T.; Marshall, E.D.; Wang, L.C.: J. Mater. Res. 3 (1988) 914.10.1557/JMR.1988.0914Search in Google Scholar
90Mas Massalski, T.B. et al. (eds.): Binary Alloy Phase Diagrams, ASM, Materials Park, OH (1990).Search in Google Scholar
90Str Stremsdoerfer, G.; Martin, J.R.; Clechet, P.; Nguyen-Du: J. Electrochem. Soc. 137 (1990) 256.10.1149/1.2086378Search in Google Scholar
91Vil Villars, P.; Calvert, L.D.: Pearson’s Handbook of Crystallographic Data for Intermetallic Phases, ASM, Material Park, OH (1991).Search in Google Scholar
93Lin Lin, C.F.; Mohney, S.E.; Chang, Y.A.: J. Appl. Phys. 74 (1993) 4398.10.1063/1.354410Search in Google Scholar
94Swe Swenson, D.; Chang, Y.A.: Mat. Sci. Eng. B 22 (1994) 267.10.1016/0921-5107(94)90255-0Search in Google Scholar
95Fu Fu, H.G.; Huang, T.S.: Sol.-State Electr. 38 (1995) 89.10.1016/0038-1101(94)E0064-LSearch in Google Scholar
96Kra Kraus, W.; Nolze, G.: J. Appl. Cryst. 29 (1996) 301.10.1107/S0021889895014920Search in Google Scholar
98Hae Häusermann, U.; Elding-Pontén, M.; Svensson, Ch.; Lidin, S.: Chem. Eur. J. 4 (1998) 1007.10.1002/(SICI)1521-3765(19980615)4:6<1007::AID-CHEM1007>3.0.CO;2-7Search in Google Scholar
98Kim Kim, H.S.; Lee, K.H.; Shin, M.C.; Kim, S.Y.; Dzo, M.H.: Scripta Mater. 38 (1998) 1549.10.1016/S1359-6462(98)00071-2Search in Google Scholar
98Kup Kuper, Ch.; Peng, W.; Pisch, A.; Goesmann, F.; Schmid-Fetzer, R.: Z. Metallkd. 89 (1998) 855.Search in Google Scholar
99Kra Kraus, W.; Nolze, G.: PowderCell for Windows Version 2.3, Federal Institute for Materials Research and Testing, Berlin (1999).Search in Google Scholar
99Won Wong, W.S.; Wengrow, A.B.; Cho, Y.; Salleo, A.; Quitoriano, N.J.; Cheung, N.W.; Sands, T.: J. Electr. Mat. 28 (1999) 1409.10.1007/s11664-999-0131-xSearch in Google Scholar
00Kim Kim, H.S.; Dzo, M.H.; Lee, K.H.; Shin, M.C.: J. Mat. Sci. 35 (2000) 4989.10.1023/A:1004898829222Search in Google Scholar
00Won Wong,W.S.; Sands, T.; Cheung, N.W.; Kneissl, M.; Bour, D.P.; Mei, P.; Romano, L.T.; Johnson, N.M.: Appl. Phys. Lett. 77 (2000) 2822.10.1063/1.1319505Search in Google Scholar
01Guo Guo, F.; Lee, J.; Choi, S.; Lucas, J.P.; Bieler, T.R.; Subramanian, K.N.: J. Electr. Mat. 30 (2001) 1073.10.1007/s11664-001-0132-xSearch in Google Scholar
01Qui Quitoriano, N.; Wong, W.S.; Tsakalakos, L.; Cho, Y.; Sands, T.: J. Electr. Mat. 30 (2001) 1471.10.1007/s11664-001-0204-ySearch in Google Scholar
01Won Wong, W.S.; Kneissl, M.; Treat, D.W.; Teepe, M.; Miyashita, N.; Johnson, N.M.: Mat. Res. Soc. Symp. Proc. 681 E (2001) I6.1.1–I.6.1.9.10.1557/PROC-681-I6.1Search in Google Scholar
02Lee Lee, J.G.; Guo, F.; Subramanian, K.N.; Lucas, J.P.: Soldering and Surface Mount Technology (in press).Search in Google Scholar
02Stu1 Studnitzky, T.; Onderka, B.; Schmid-Fetzer, R.: Z. Metallkd. 93 (2002) 48.10.3139/146.020048Search in Google Scholar
02Stu2 Studnitzky, T.; Schmid-Fetzer, R.: 93 (2002) 894 to Z. Metallkd. 02Stu3 Studnitzky, T.; Schmid-Fetzer, R.: J. Electron. Mat., in press.10.3139/146.020894Search in Google Scholar
ICDD ICDD Powder Diffraction File, International Center for Diffraction Data, Newtown Square, PA 19073 ±3273 (1998).Search in Google Scholar
© 2002 Carl Hanser Verlag, München
