Chlorine containing phosphonic acid esters (tridilorphon-type) have been investigated quantitatively by ESR after X-irradiation at room temperature. Radical yields are between 0.2 and 1.7 radicals per 100 eV. In the case of trichlorphon the radical concentration is 7.5·1018 spins per gram at 40 Mrad.
Stabilisation and kinetics of radiation-induced radicals in the solid state matrix at high irradiation doses in dependence of storage time, oxygen-effect and temperature are discussed. The obtained results suggest a model for the behaviour of the matrix at high irradiation doses. According to this model the lattice of molecular crystals is modified by the accumulation of recombination products arising from the induced radicals. These lattice imperfections cause a diminution of stabilizing properties for the radicals. The decrease of the dose-yield-curve at higher doses than 40 Mrad and the dose-dependent radical kinetics during storage can be explained by this model.
© 1946 – 2014: Verlag der Zeitschrift für Naturforschung
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.