tm - Technisches Messen

Published by Oldenbourg Wissenschaftsverlag

Volume 59 Issue 1

Issue of tm - Technisches Messen

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Contents
Journal Overview

Publicly Available January 1, 1992

Inhalt / Contents

Page range: 1-1

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January 1, 1992

Impressum

Page range: 2-2

January 1, 1992

Dynamischer Autofokussensor zur dreidimensionalen Mikrostrukturerfassung / Dynamic autofocussensor for measuring threedimensional microstructures

L. Overmeyer, K. Dickmann

Page range: 3-9

January 1, 1992

Modenunabhängiger Laserleistungsdetektor in Dickschichttechnik / Mode independent thick film laser power detector

J. Nicolics, W. Smetana, T. Fellner

Page range: 10-13

January 1, 1992

Produktinformationen / Product information

Page range: 13-13

January 1, 1992

Approximation der spektralen Ëmissionsgrade bei der Mehrwellenlängenpyrometrie / Approximation of spectral emissivities in multi-wavelength pyrometry

L. Fiessler, M. Groll, G. Neuer

Page range: 14-20

January 1, 1992

Anwendung von Oversampling-Verfahren zur Erhöhung der Auflösung digital erfaßter Signale / Increase of resolution of digitally acquired data by means of oversampling methods

M. Barmettier, P. Gruber

Page range: 21-25

January 1, 1992

Veranstaltungen / Meetings

Page range: 25-25

January 1, 1992

Produktinformationen / Product information

Page range: 25-25

January 1, 1992

tm-Gastvorlesung / tm Tutorial: Digitale Meßwertverarbeitung / Digital signal processing

R. Best

Page range: 26-32

January 1, 1992

Hinweise für Autoren

Page range: 32-32

January 1, 1992

tm-Serie / tm Series: Industrielle Gasanalyse / Industrial gas analysis

J. Staab

Page range: 33-38

January 1, 1992

Produktinformationen / Product information

Page range: 39-39

January 1, 1992

Veranstaltungskalender / Meetings to come

Page range: 40-40

About this journal

Objective

The journal promotes dialogue between the developers of application-oriented sensors, measurement systems, and measurement methods and the manufacturers and measurement technologists who use them.

Topics

The manufacture and characteristics of new sensors for measurement technology in the industrial sector
New measurement methods
Hardware and software based processing and analysis of measurement signals to obtain measurement values
The outcomes of employing new measurement systems and methods

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