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You are looking at 1-6 of 6 items for: 65C60

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Hofert, Marius / Memartoluie, Amir / Saunders, David / Wirjanto, Tony

Improved algorithms for computing worst Value-at-Risk

Product Type: Journals/Yearbooks
Mamode Khan, Naushad / Rumjaun, Wasseem / Sunecher, Yuvraj / Jowaheer, Vandna

Computing with bivariate COM-Poisson model under different copulas

Product Type: Journals/Yearbooks
Schimek, Michael G. / Budinská, Eva / Kugler, Karl G. / Švendová, Vendula / Ding, Jie / Lin, Shili

TopKLists: a comprehensive R package for statistical inference, stochastic aggregation, and visualization of multiple omics ranked lists

Grigoriu, Mircea

An efficient Monte Carlo solution for problems with random matrices

Product Type: Journals/Yearbooks
Nayeban, S. / Rezaei Roknabadi, A. H. / Mohtashami Borzadaran, G. R.

Comparison of Lower Bounds for the Variance of Unbiased Estimators for some Well-known Families of Distributions

Product Type: Journals/Yearbooks
Alonso Fernández, J.R. / García Nieto, P.J. / Martínez Torres, J. / Díaz Muñiz, C.

Analysis of Cyanotoxins Presence from Experimental Cyanobacteria Concentrations in the Trasona Reservoir (Northern Spain) Using Support Vector Regression

You are looking at 1-6 of 6 items for: 65C60

  • Keywords: 65C60x
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