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237 J. Adv. Oxid. Technol. Vol. 9, No.2, 2006 ISSN 1203-8407 © 2006 Science & Technology Network, Inc. Thin Films Deposited from Trimethylmethoxysilane Zenobia Rżanek-Boroch and Krzysztof Jóźwik Faculty of Chemistry, Warsaw University of Technology, 00-664 Warszawa, Noakowskiego 3, Poland Abstract: The deposition and characterization of thin films of silicon oxide in Dielectric Barrier Discharge at atmospheric pressure from trimethylmethoxysilane as the precursor was carried out. Introduction Plasma deposited thin layers of silicon

DOI 10.1515/green-2012-0009   Green 2012; 2(4): 149–157 Hans-Werner Schock* High Efficiency Thin-Film Solar Cells Abstract: Production of photovoltaics is growing world- wide on a gigawatt scale. Among the thin film technolo- gies, Cu(In,Ga)S,Se2 (CIS or CIGS) based solar cells have been the focus of more and more attention. This paper aims to analyze the success of CIGS based solar cells and the potential of this technology for future photovoltaics large-scale production. Specific material properties make CIS unique and allow the preparation of the

in Green

electron mobility, they hold the promise of having the lowest losses at these frequencies. Out of the multitude of possibilities, gold, silver, and aluminum are the ones that are mainly used. Although the alkali metals are theoretically better due to their even higher electron mobility and, thus, lower losses, their notorious chemical and mechanical instability makes them impractical to work with. There have been only very few attempts where plasmons in these metals were characterized [32]. 3.1 Gold thin films Gold is the plasmonic material mostly used nowadays. Its

Abstract

In experimental thin film physics, there is a demand to characterize a growing thin film or the thin film resulting from an experiment. While methods for discontinuous, island-like thin films have been developed, there is a lack of results directly applicable to semicontinuous thin film description. In this contribution, a unique combination of image processing methods is collected and further developed, which results in a novel set of semicontinuous thin film descriptors. In particular, the shape of the thin film contours and the thin film image intensity profiles are analyzed in a multiscale manner. The descriptiveness of the proposed features is demonstrated on a few thin film photographs from real experiments. This work establishes a basis for further measurement, description, simulation or other processing in the physics of semicontinuous thin films, using any direct imaging modality.

Z. Phys. Chem. 224 (2010) 1795–1829 / DOI 10.1524/zpch.2010.0055 © by Oldenbourg Wissenschaftsverlag, München Nanoanalysis and Ion Conductivity of Thin Film Battery Materials By G. Schmitz∗, R. Abouzari, F. Berkemeier, T. Gallasch, G. Greiwe, T. Stockhoff, and F. Wunde Institute of Material Physics, WWU Münster, Germany, Wilhelm-Klemm-Str. 10, 48149 Münster, Germany (Received September 20, 2010; accepted in revised form September 30, 2010) Thin Films / Battery Electrodes / Microscopical Analysis / Glass Membranes / Ionic Conductivity Thin film ion

815 Pure Appl. Chem., Vol. 77, No. 5, pp. 815–826, 2005. DOI: 10.1351/pac200577050815 © 2005 IUPAC INTERNATIONAL UNION OF PURE AND APPLIED CHEMISTRY POLYMER DIVISION* POLYANILINE: THIN FILMS AND COLLOIDAL DISPERSIONS* (IUPAC Technical Report) Prepared for publication by JAROSLAV STEJSKAL1,‡ AND IRINA SAPURINA2 1Institute of Macromolecular Chemistry, Academy of Sciences of the Czech Republic, 162 06 Prague 6, Czech Republic; 2Institute of Macromolecular Compounds, Russian Academy of Sciences, St. Petersburg 199004, Russia *Publication resulting from work carried

J. Non-Equilib. Thermodyn. 38 (2013), 377–390 DOI 10.1515/jnetdy-2013-0023 © de Gruyter 2013 Analytical solution for phonon transport across thin films Bekir S. Yilbas, Ahmed Y. Al-Dweik and Saad Bin Mansoor Communicated by David Jou Keywords. Films, Boltzmann transport equation, heat transfer in thin films, phonon transport. Abstract The numerical solution of the Boltzmann equation for the thin film applica- tions requires extensive computational power. An analytical solution to the phonon transport equation is fruitful in order to reduce the computational

products ( Isogai et al. 2011 ; Klemm et al. 2012 ; Khalil et al. 2012 ). TOCN is also promising in terms of CS adsorption. Thin films with a thickness below 100 nm are good models for cellulosic substrates (Ristić et al. 2014), which have a homogeneous surface morphology. One of the powerful tools for studying polymer adsorption on thin films is the quartz crystal microbalance with dissipation (QCM-D), which is a kind of a nanogram-sensitive balance. Until now, cellulose thin films were used mainly as model substrates for regenerated cellulose (RC). The interaction of

of H-doped ZnO”, Optical and Quantum Electronics , vol. 48 no. 5 (2016),. [4] P. Kelly and R. Arnell, “Magnetron sputtering: a review of recent developments and applications”, Vacuum , vol. 56 no. 3 (2000), 159-172. [5] Z. Remes, J. Stuchlik, A. Purkrt, Y.-Y. Chang, J. Jirasek, P. Stenclova, V. Prajzler and P. Nekvindova, “ZnO Thin Films Prepared by Reactive Magnetron Sputtering”, NANOCON 2016 - 8th International Conference on Nanomaterials - Research and Application , Conference Proceedings, 8 vol. Hotel Voronez I, Brno, Czech Republic, TANGER Ltd.(2016). [6] Y

Abstract

The structuring features of As38S18Se44 chalcogenide (ChG) inorganic glasses were studied using electron beam (EB) lithography. After the EB exposure, ChG thin films are etched in a high-selectivity alkaline amine, with the dissolution rate being linearly proportional to the electron dose. The Gaussian EB intensity profile is well replicated in the shape of individual lines, which allows high-resolution smoothlyshaped nanostructures to be obtained. The height of developed patterns can be controlled through changing the applied electron dose. These features make the proposed technique widely applicable in the fields of photonics and optics. The results obtained would help to better understand the processes occurring in ChG thin films at recording the diffractive gratings, and thus achieve a better profile and surface roughness control.