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models, e.g. on beneficiation processes [ 10 ]. A variety of methods including polarization microscopy, electron microscopy, X-ray diffraction, differential thermal analysis and infrared and optical emission spectrometry has been applied in the last decades for quantitative mineralogical studies, e.g. [ 11 – 13 ]. Automated procedures to generate quantitative mineralogical data require unattended identification of mineral phases. Furthermore, not only to account for target elements of mining but also in order to identify deleterious elements (e.g. U, Th), such systems

1 Introduction Over the last decade, numerous experimental methods based on transmission electron microscopy have undergone quantum leaps. These abrupt advancements are mainly due to the significantly improved stability of microscope platforms and the availability of new electron optical devices. Aside from high performance spectrometers for electron energy-loss (EELS) and energy-dispersive X-ray spectroscopies (EDXS), fast and highly sensitive digital cameras based on CMOS technology have been introduced. These advanced cameras have replaced the inherently

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Electron microscopy 116 Electron microscopy P100 Ab-initio Calculations of electronic structure of TlInS2 N. Ismayilova1 1Azerbaijan National Academy of Sciences, Institute of Physics, Baku, Azerbaijan Abstract The electronic structure was calculated for TlInS2 from first principle. In the literature there are some experimental data about electronic spectrum of the crystal TlInS2. In Ref. [1, 2, 3] authors have obtained the optical indirect gap of Egi =2.27 eV and the direct gap of Egd =2.47 eV. In contradiction with these works, experimental

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Electron microscopy 27 Electron microscopy S10-01 Elastic and Inelastic Contributions in Electron Diffraction T. Gorelik1 1Universität Ulm, Central fascility for Electron Microscopy, Ulm, Germany Electron diffraction is an attractive method for structure analysis. Numerous examples illustrate the cases when electron diffraction was the only method able to resolve the structure of a material. The interaction of electrons with matter is a complex process resulting in various events, which can be grouped into processes preserving the energy of the

REFERENCES 1. Atherton OE, Robins RW, Rentfrow PJ, Bobo D, Robinson KJ, Islam J et al. Nanoparticle-based medicines: a review of FDA approved materials and clinical trials to date. Pharm Res 2016; 33: 2373–87. 2. Lim Ct, Han J, Guck J, Espinosa H. Micro and nanotechnology for biological and biomedical applications. Med Biol Eng Comput 2010; 48: 941–3. 3. Costanzo M, Carton F, Malatesta M. Microscopy techniques in nanomedical research. Microscopie 2017; 3: 66–71. 4. Malatesta M. Transmission electron microscopy for nanomedicine: novel applications for long

Structure of the ATP-Synthase from Chloroplasts and Mitochondria Studied by Electron Microscopy Egbert J. Boekema Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4—6, D-1000 Berlin 33, Bundesrepublik Deutschland Günter Schmidt, Peter Gräber Max-Volmer-Institut, Technische Universität Berlin, Straße des 17. Juni 135, D-1000 Berlin 12, Bundesrepublik Deutschland Jan A. Berden Biochemisch Laboratorium, Universiteit van Amsterdam. Plantage Muidergracht 12, Amsterdam, The Netherlands Z. Naturforsch. 43c, 219-225 (1988); received December 1

American Mineralogist, Volume 94, pages 262–269, 2009 0003-004X/09/0203–262$05.00/DOI: 10.2138/am.2009.2989 262 The application of Lorentz transmission electron microscopy to the study of lamellar magnetism in hematite-ilmenite Takeshi kasama,1,* Rafal e. Dunin-BoRkowski,2 ToRu asaka,3 RichaRD J. haRRison,4 Ryan k.k. chong,1 suzanne a. mcenRoe,5 eDwaRD T. simpson,1 yoshio maTsui,3 anD anDRew puTnis6 1Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, U.K. 2Center for Electron Nanoscopy

-mail: kogure@eps.s.u-tokyo.ac.jp Stacking structures in pyrophyllite revealed by high-resolution transmission electron microscopy (HRTEM) TOSHIHIRO KOGURE,1,2,* MAYUMI JIGE,3 JUN KAMEDA,1 AKIHIKO YAMAGISHI,1,2 RITSURO MIYAWAKI,4 AND RYUJI KITAGAWA3 1Department of Earth and Planetary Science, Graduate School of Science, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo, 113-0033, Japan 2CREST, Japan Science and Technology Corporation, Honcho 4-1-8, Kawaguchi, Saitama 332-0012, Japan 3Department of Earth and Planetary Sciences, Faculty of Sciences, Hiroshima University

Corros Rev 29 (2011): 229–239 © 2011 by Walter de Gruyter • Berlin • Boston. DOI 10.1515/CORRREV.2011.013 Focused ion beam and transmission electron microscopy as a powerful tool to understand localized corrosion phenomena Edoardo Bemporad, Marco Sebastiani *, Daniele De Felicis, Vincenzo Mangione and Fabio Carassiti Mechanical and Industrial Engineering Department , University of Rome “ ROMA TRE ” , Via della Vasca Navale, 79, 00146, Rome , Italy , e-mail: marco.sebastiani@stm.uniroma3.it *Corresponding author Abstract The present

Nanotechnol Rev 1 (2012): 389–425 © 2012 by Walter de Gruyter • Berlin • Boston. DOI 10.1515/ntrev-2012-0018 Direct structure analysis of advanced nanomaterials by high-resolution electron microscopy Takeo Oku Department of Materials Science , The University of Shiga Prefecture, Hassaka 2500, Hikone, Shiga 522-8533 , Japan, e-mail: oku@mat.usp.ac.jp Abstract High-resolution electron microscopy (HREM) analysis has contributed to the direct structure analysis of advanced nano- structured materials, of which the properties of these materi- als are