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Advanced Optical Technologies

Editor-in-Chief: Pfeffer, Michael


CiteScore 2018: 1.42

SCImago Journal Rank (SJR) 2018: 0.499
Source Normalized Impact per Paper (SNIP) 2018: 1.346

In co-publication with THOSS Media GmbH

Online
ISSN
2192-8584
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Volume 4, Issue 1

Issues

Optical simulation of microstructured surfaces

Donald J. Schertler / Paul O. McLaughlin
Published Online: 2015-01-20 | DOI: https://doi.org/10.1515/aot-2014-0053

Abstract

We present techniques and results of optical simulations of microstructured surfaces using BSDF measurements.

Keywords: BSDF; diffusers; microstructured surfaces; scatter; simulation

References

  • [1]

    J. C. Stover, ‘Optical Scattering, Measurement and Analysis’, 2nd ed. (SPIE Press, Bellingham, WA, USA, 1995).Google Scholar

  • [2]

    P. Beckman and A. Spizzichino, ‘The Scattering of Electromagnetic Waves from Rough Surfaces’ (Pergamon Press, New York, NY, USA, 1963).Google Scholar

  • [3]

    J. E. Harvey, ‘Light scattering characteristics of optical surfaces,’ Ph.D. Dissertation, University of Arizona, (1976).Google Scholar

  • [4]

    Engineered Diffuser™ is a trademark of RPC Photonics, Inc., Rochester, NY, USA.Google Scholar

  • [5]

    Simulations were performed using ASAP from Breault Research Organization, Tucson, AZ, USA.Google Scholar

  • [6]

    Intensity distributions in angle space correspond to Type B photometry of the Illuminating Engineering Society, New York, NY, USA. Measured intensity distributions correspond to Type C photometry.Google Scholar

About the article

Corresponding author: Donald J. Schertler, RPC Photonics, Inc., 330 Clay Rd. Rochester, NY 14623, USA, e-mail:


Received: 2014-10-27

Accepted: 2014-12-17

Published Online: 2015-01-20

Published in Print: 2015-02-01


Citation Information: Advanced Optical Technologies, Volume 4, Issue 1, Pages 87–91, ISSN (Online) 2192-8584, ISSN (Print) 2192-8576, DOI: https://doi.org/10.1515/aot-2014-0053.

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