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Licensed Unlicensed Requires Authentication Published by De Gruyter March 10, 2010

Nonparametric Capability Indices

  • T. V. Ramanathan , A. D. Dharmadhikari and Bovas Abraham

Abstract

Process capability indices Cp and Cpk are widely used in statistical quality control to assess the capability of a process. These indices are defined, based on the assumption that the quality characteristic follows a normal distribution. In this paper two new capability indices are considered, which do not depend on any distributional assumptions. The estimation and asymptotic properties of the estimators of these indices are investigated. Two examples are given to illustrate the importance of the given indices and their computational procedures.

Published Online: 2010-03-10
Published in Print: 2003-April

© Heldermann Verlag

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