Jump to ContentJump to Main Navigation
Show Summary Details

The Forum

A Journal of Applied Research in Contemporary Politics

Ed. by Disalvo, Daniel / Stonecash, Jeffrey


IMPACT FACTOR 2015: 0.250
5-year IMPACT FACTOR: 0.318

SCImago Journal Rank (SJR) 2015: 0.255
Source Normalized Impact per Paper (SNIP) 2015: 0.296
Impact per Publication (IPP) 2015: 0.191

49,00 € / $74.00 / £37.00*

Online
ISSN
1540-8884
See all formats and pricing



Select Volume and Issue

Issues

30,00 € / $42.00 / £23.00

Get Access to Full Text

Managing Dual-Use Technology in an Age of Uncertainty

Judith Reppy1

1Cornell University

Citation Information: The Forum. Volume 4, Issue 1, ISSN (Online) 1540-8884, DOI: 10.2202/1540-8884.1116, May 2006

Publication History

Published Online:
2006-05-31

'Dual use' refers to those technologies that can, with some adaptation, have both military and civilian applications. It is a concept rooted in the dichotomies of the Cold War. Over the last 55 years it has served both to structure an export control regime aimed at limiting the diffusion of advanced technology to hostile states and to underpin a range of domestic defense acquisition policies aimed at increasing the utilization of civilian technologies by the military. With the end of the Cold War and the erosion of the boundaries between civil and military technologies, U.S. policy to control the spread of military-related technology is in disarray. A more workable policy would replace open-ended support for new military technology with a realistic assessment of the security risks and needs, and limit export controls to a few, highly dangerous technologies.

Citing Articles

Here you can find all Crossref-listed publications in which this article is cited. If you would like to receive automatic email messages as soon as this article is cited in other publications, simply activate the “Citation Alert” on the top of this page.

[1]
Caitríona McLeish and Paul Nightingale
Research Policy, 2007, Volume 36, Number 10, Page 1635

Comments (0)

Please log in or register to comment.