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Frequenz

Journal of RF-Engineering and Telecommunications

Editor-in-Chief: Jakoby, Rolf

12 Issues per year


IMPACT FACTOR 2016: 0.462

CiteScore 2016: 0.43

SCImago Journal Rank (SJR) 2016: 0.183
Source Normalized Impact per Paper (SNIP) 2016: 0.333

Online
ISSN
2191-6349
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Volume 23, Issue 2

Issues

Das Messen von komplexen Leitwerten und Widerständen mit der Scheinwiderstands-Meßbrücke

K. Paetzold,

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Citation Information: Frequenz, Volume 23, Issue 2, Pages 42–49, ISSN (Online) 2191-6349, ISSN (Print) 0016-1136, DOI: https://doi.org/10.1515/FREQ.1969.23.2.42.

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©2011 by Walter de Gruyter GmbH & Co.. Copyright Clearance Center

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