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Frequenz

Journal of RF-Engineering and Telecommunications

Editor-in-Chief: Jakoby, Rolf


IMPACT FACTOR 2017: 0.280
5-year IMPACT FACTOR: 0.297

CiteScore 2017: 0.38

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Source Normalized Impact per Paper (SNIP) 2017: 0.243

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2191-6349
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Volume 71, Issue 3-4

Issues

Characterizing Dielectric Materials using Monostatic Transmission- and Reflection-Ellipsometry

Jan Barowski / Ilona Rolfes
Published Online: 2016-12-20 | DOI: https://doi.org/10.1515/freq-2016-0204

Abstract

The characterization of dielectric materials at microwave frequencies can be done by various measurement principles. Free space methods are a commonly used approach if the material under test (MUT) has to be characterized in-situ or in a non-destructive manner. Since the transmission and reflection parameters of a finite sized dielectric slab typically depend on its thickness, accurate knowledge about this parameter is of high importance. The ellipsometric approach presented in this paper eliminates the thickness dependence and thus allows to reduce a major source of error. This is achieved by performing four measurements. These measure the transmission and reflection factors of the MUT in both polarizations at an incident angle of 45°. The high stability of the measurement allows a simple monostatic setup utilizing a single antenna. The measurements in this paper are performed using Polytetrafluoroethylene (PTFE) and Polyvinylchloride (PVC) blocks in the frequency range from 22 GHz to 26 GHz.

Keywords: metrology; permittivity; electromagnetic measurements; reflectometry

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About the article

Received: 2016-07-03

Published Online: 2016-12-20

Published in Print: 2017-03-01


Citation Information: Frequenz, Volume 71, Issue 3-4, Pages 185–193, ISSN (Online) 2191-6349, ISSN (Print) 0016-1136, DOI: https://doi.org/10.1515/freq-2016-0204.

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