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High Temperature Materials and Processes

Editor-in-Chief: Fukuyama, Hiroyuki

Editorial Board: Waseda, Yoshio / Fecht, Hans-Jörg / Reddy, Ramana G. / Manna, Indranil / Nakajima, Hideo / Nakamura, Takashi / Okabe, Toru / Ostrovski, Oleg / Pericleous, Koulis / Seetharaman, Seshadri / Straumal, Boris / Suzuki, Shigeru / Tanaka, Toshihiro / Terzieff, Peter / Uda, Satoshi / Urban, Knut / Baron, Michel / Besterci, Michael / Byakova, Alexandra V. / Gao, Wei / Glaeser, Andreas / Gzesik, Z. / Hosson, Jeff / Masanori, Iwase / Jacob, Kallarackel Thomas / Kipouros, Georges / Kuznezov, Fedor


IMPACT FACTOR 2017: 0.433
5-year IMPACT FACTOR: 0.436

CiteScore 2018: 0.58

SCImago Journal Rank (SJR) 2018: 0.231
Source Normalized Impact per Paper (SNIP) 2018: 0.377

Open Access
Online
ISSN
2191-0324
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Volume 27, Issue 6

Issues

EML Processing Measurement Techniques

I. Egry, / G. Lohöfer, / D. Matson,
Published Online: 2011-05-06 | DOI: https://doi.org/10.1515/HTMP.2008.27.6.389

About the article

Published Online: 2011-05-06

Published in Print: 2008-12-01


Citation Information: High Temperature Materials and Processes, Volume 27, Issue 6, Pages 389–400, ISSN (Online) 2191-0324, ISSN (Print) 0334-6455, DOI: https://doi.org/10.1515/HTMP.2008.27.6.389.

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©2011 by Walter de Gruyter GmbH & Co..Get Permission

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[1]
J. Chang, H.P. Wang, K. Zhou, and B. Wei
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