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High Temperature Materials and Processes

Editor-in-Chief: Fukuyama, Hiroyuki

Editorial Board: Waseda, Yoshio / Fecht, Hans-Jörg / Reddy, Ramana G. / Manna, Indranil / Nakajima, Hideo / Nakamura, Takashi / Okabe, Toru / Ostrovski, Oleg / Pericleous, Koulis / Seetharaman, Seshadri / Straumal, Boris / Suzuki, Shigeru / Tanaka, Toshihiro / Terzieff, Peter / Uda, Satoshi / Urban, Knut / Baron, Michel / Besterci, Michael / Byakova, Alexandra V. / Gao, Wei / Glaeser, Andreas / Gzesik, Z. / Hosson, Jeff / Masanori, Iwase / Jacob, Kallarackel Thomas / Kipouros, Georges / Kuznezov, Fedor

IMPACT FACTOR 2018: 0.427
5-year IMPACT FACTOR: 0.471

CiteScore 2018: 0.58

SCImago Journal Rank (SJR) 2018: 0.231
Source Normalized Impact per Paper (SNIP) 2018: 0.377

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Volume 30, Issue 1-2


Structural Analysis of Dispersion Strengthened Al-Al4C3 Material by XRD Method

Marián Varchola / Karel Saksl / Juraj Durišin / Michal Besterci
Published Online: 2011-04-19 | DOI: https://doi.org/10.1515/htmp.2011.018


Dispersion strengthened materials belong into the group of composite materials, which are made mainly by powder metallurgy. Their structure has a polycrystalline matrix, in which dispersion particles are incorporated, mainly oxide, carbide and nitride type. The Al-C systems belong among modern materials designed for work at elevated temperature. This work focused on a study of the microstructure in containing 4 vol.% Al4C3.

The microstructure was analyzed X-ray diffraction line profile analysis. It is a powerful and convenient method to probe the microstructural characteristics of composites materials. In this paper the development of texture and size of crystallites in composite material dependence on annealing time and temperature was examined. Texture of the experimental materials was analyzed by means texture coefficient (TC). TC for the (220) plane in Al4C3 composite indicate the presence of markedly deformed texture. Size of crystallites depends on annealing temperatures and times.

Keywords.: X-ray diffraction (XRD); texture; crystallographic planes; size of crystallites

About the article

Corresponding author: Marián Varchola, Institute of Materials Research SAS, Watsonova 47, 040 01 Košice, SR

Received: 2010-10-08

Accepted: 2010-10-26

Published Online: 2011-04-19

Published in Print: 2011-04-01

Citation Information: High Temperature Materials and Processes, Volume 30, Issue 1-2, Pages 127–130, ISSN (Online) 2191-0324, ISSN (Print) 0334-6455, DOI: https://doi.org/10.1515/htmp.2011.018.

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