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Journal of Applied Mathematics, Statistics and Informatics

The Journal of University of Saint Cyril and Metodius

Editor-in-Chief: Kvasnicka, Vladimír

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Mathematical Citation Quotient (MCQ) 2016: 0.02

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1339-0015
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Reliability Properties of Residual Life Time and Inactivity Time of Series and Parallel System

Nitin Gupta
  • Department of Mathematics, Jaypee University of Information Technology, Waknaghat, Solan (H.P.) Pin - 173 234 INDIA
  • Other articles by this author:
  • De Gruyter OnlineGoogle Scholar
/ Neeraj Gandotra
  • Department of Mathematics, Jaypee University of Information Technology, Waknaghat, Solan (H.P.) Pin - 173 234 INDIA
  • Other articles by this author:
  • De Gruyter OnlineGoogle Scholar
/ Rakesh Bajaj
  • Department of Mathematics, Jaypee University of Information Technology, Waknaghat, Solan (H.P.) Pin - 173 234 INDIA
  • Other articles by this author:
  • De Gruyter OnlineGoogle Scholar
Published Online: 2012-08-13 | DOI: https://doi.org/10.2478/v10294-012-0001-7

Reliability Properties of Residual Life Time and Inactivity Time of Series and Parallel System

The concepts of residual life time and inactivity time are extensively used in reliability theory for modeling life time data. In this paper we prove some new results on stochastic comparisons of residual life time and inactivity time in series and parallel systems. These results are in addition to the existing results of Li & Zhang (2003) and Li & Lu (2003). We also present sufficient conditions for aging properties of the residual life time and inactivity life time of series and parallel systems. Some examples from Weibull and Gompertz distributions are provided to support the results as well.

Keywords: Likelihood ratio order; series system; parallel system

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About the article


Published Online: 2012-08-13

Published in Print: 2012-05-01


Citation Information: , Volume 8, Issue 1, Pages 5–16, ISSN (Print) 1336-9180, DOI: https://doi.org/10.2478/v10294-012-0001-7.

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