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Metrology and Measurement Systems

The Journal of Committee on Metrology and Scientific Instrumentation of Polish Academy of Sciences

4 Issues per year


IMPACT FACTOR 2016: 1.598

CiteScore 2016: 1.58

SCImago Journal Rank (SJR) 2016: 0.460
Source Normalized Impact per Paper (SNIP) 2016: 1.228

DE GRUYTER OPEN

Open Access

    Open Access
    Online
    ISSN
    2300-1941
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    Overview

    The aim of the journal is to enhance the world-wide exchange of information on the advancements in the field of measurement sciences and technology, with particular focus on the areas where the activity of other metrology-related journals is insufficient. The main priority is given to supporting the young researchers in their scientific development – by publishing research results recorded in their Ph.D. and D.Sc. theses. Fostering of publication activities in the countries of Central and Eastern Europe is also an important element of the journal's mission. The substance-related priority is given to IT-based measurement methods and techniques, especially to DSP-based, AI-based and wireless instrumentation.
    More information: on website www.metrology.pg.gda.pl

    Aims and Scope

    Why subscribe and read

    Metrology and Measurement Systems is an international journal, issued quarterly under auspices of the Polish Academy of Sciences. It is a peer-reviewed journal, launched in 1988, since 2001 it appears in English. Actually is edited both in paper and electronic format. The journal is source of high quality information from research, development and applications of measurement sciences and technology. Over 20 years of experience in publishing original paper dealing with various measurement methods and instrumentations applied in many field of engineering and medicine.

    Why submit

    • Wide and important for research and engineering activity list of topics covered by the journal: general principles of measurement, measurement of physical, chemical and biological quantities, medical measurements, sensors and transducers, measurement data acquisition, measurement signal transmission and processing, measurement systems and microsystems, internet-based and wireless-communication-based measurements, virtual and AI-based instruments, design and manufacture of instruments.
    • Fair and constructive peer review.
    • Short publication cycle – average 6 months.
    • Free language assistance for authors from non-English speaking regions.

    Similarity Check Plagiarism Screening System

    The editorial board is participating in a growing community of Similarity Check System's users in order to ensure that the content published is original and trustworthy. Similarity Check is a medium that allows for comprehensive manuscripts screening, aimed to eliminate plagiarism and provide a high standard and quality peer-review process.

    Detailed description of the Similarity Check System can be found at:
    https://www.crossref.org/services/similarity-check/

    Details

    Submission of Manuscripts

    Instructions for Authors

    Please submit your manuscripts to Metrology and Measurement Systems via Internet Editorial System, accessible at http://www.editorialsystem.com/mms

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    Abstracting & Indexing

    Metrology and Measurement Systems is covered by the following services:

    • Arianta
    • Baidu Scholar
    • BazTech
    • Celdes
    • Clarivate Analytics (formerly Thomson Reuters) - Journal Citation Reports/Science Edition
    • Clarivate Analytics (formerly Thomson Reuters) - Science Citation Index Expanded
    • CNKI Scholar (China National Knowledge Infrastructure)
    • CNPIEC
    • DOAJ (Directory of Open Access Journals)
    • EBSCO (relevant databases)
    • EBSCO Discovery Service
    • Elsevier - Compendex
    • Elsevier - Engineering Village
    • Elsevier - SCOPUS
    • Genamics JournalSeek
    • Google Scholar
    • Index Copernicus
    • Inspec
    • J-Gate
    • JournalTOCs
    • KESLI-NDSL (Korean National Discovery for Science Leaders)
    • Microsoft Academic
    • Naviga (Softweco)
    • Primo Central (ExLibris)
    • ProQuest (relevant databases)
    • ReadCube
    • ResearchGate
    • SCImago (SJR)
    • Sherpa/RoMEO
    • Summon (Serials Solutions/ProQuest)
    • TDNet
    • TEMA Technik und Management
    • Ulrich's Periodicals Directory/ulrichsweb
    • WanFang Data
    • WorldCat (OCLC)

    Editorial Information

    Editor-in-Chief
    Janusz Smulko, Gdansk University of Technology, Poland

    International Programme Committee
    Andrzej ZAJĄC, Chairman, Military University of Technology, Poland
    Bruno ANDO, University of Catania, Italy
    Martin BURGHOFF, Physikalisch-Technische Bundesanstalt, Germany
    Marcantonio CATELANI, University of Florence, Italy
    Numan DURAKBASA, Vienna University of Technology, Austria
    Domenico GRIMALDI, University of Calabria, Italy
    Laszlo KISH, Texas A&M University, USA
    Eduard LLOBET, Universitat Rovira i Virgili, Tarragona, Spain
    Alex MASON, Liverpool John Moores University, The United Kingdom
    Subhas MUKHOPADHYAY, Massey University, Palmerston North, New Zealand
    Janusz MROCZKA, Wrocław University of Technology, Poland
    Antoni ROGALSKI, Military University of Technology, Poland
    Wiesław WOLIŃSKI, Warsaw University of Technology, Poland

    Associate Editors
    Zbigniew BIELECKI, Military University of Technology, Poland
    Vladimir DIMCHEV, Ss. Cyril and Methodius University, Macedonia
    Krzysztof DUDA, AGH University of Science and Technology, Poland
    Janusz GAJDA, AGH University of Science and Technology, Poland
    Teodor GOTSZALK, Wrocław University of Technology, Poland
    Ireneusz JABŁOŃSKI, Wrocław University of Technology, Poland
    Piotr JASIŃSKI, Gdańsk University of Technology, Poland
    Piotr KISAŁA, Lublin University of Technology, Poland
    Manoj KUMAR, University of Hyderabad, Telangana, India
    Fernando PUENTE LEÓN, University Karlsruhe, Germany
    Czesław ŁUKIANOWICZ, Koszalin University of Technology, Poland
    Rosario MORELLO, University Mediterranean of Reggio Calabria, Italy
    Petr SEDLAK, Brno University of Technology, Czech Republic
    Hamid M. SEDIGHI, Shahid Chamran University of Ahvaz, Ahvaz, Iran
    Roman SZEWCZYK, Warsaw University of Technology, Poland

    Language Editors
    Andrzej Stankiewicz, Gdansk University of Technology, Poland

    Technical Editors
    Agnieszka Kondratowicz, Gdansk University of Technology, Poland

    Contact
    Editorial Office of Metrology and Measurement Systems
    metrology@pg.edu.pl
    tel.: (0-58) 347-1357

    Publisher
    DE GRUYTER OPEN
    Bogumiła Zuga 32A Str.
    01-811 Warsaw, Poland
    T: +48 22 701 50 15

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