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Metrology and Measurement Systems

The Journal of Committee on Metrology and Scientific Instrumentation of Polish Academy of Sciences

IMPACT FACTOR increased in 2015: 1.140

SCImago Journal Rank (SJR) 2015: 0.554
Source Normalized Impact per Paper (SNIP) 2015: 1.363
Impact per Publication (IPP) 2015: 1.260


Open Access

    Open Access
    See all formats and pricing


    The aim of the journal is to enhance the world-wide exchange of information on the advancements in the field of measurement sciences and technology, with particular focus on the areas where the activity of other metrology-related journals is insufficient. The main priority is given to supporting the young researchers in their scientific development – by publishing research results recorded in their Ph.D. and D.Sc. theses. Fostering of publication activities in the countries of Central and Eastern Europe is also an important element of the journal's mission. The substance-related priority is given to IT-based measurement methods and techniques, especially to DSP-based, AI-based and wireless instrumentation.
    More information: on website www.metrology.pg.gda.pl

    Aims and Scope

    Why subscribe and read

    Metrology and Measurement Systems is an international journal, issued quarterly under auspices of the Polish Academy of Sciences. It is a peer-reviewed journal, launched in 1988, since 2001 it appears in English. Actually is edited both in paper and electronic format. The journal is source of high quality information from research, development and applications of measurement sciences and technology. Over 20 years of experience in publishing original paper dealing with various measurement methods and instrumentations applied in many field of engineering and medicine.

    Why submit

    • Wide and important for research and engineering activity list of topics covered by the journal: general principles of measurement, measurement of physical, chemical and biological quantities, medical measurements, sensors and transducers, measurement data acquisition, measurement signal transmission and processing, measurement systems and microsystems, internet-based and wireless-communication-based measurements, virtual and AI-based instruments, design and manufacture of instruments.
    • Fair and constructive peer review.
    • Short publication cycle – average 6 months.
    • Free language assistance for authors from non-English speaking regions.


    Submission of Manuscripts

    Instructions for Authors

    Please submit your manuscripts to Metrology and Measurement Systems via Internet Editorial System, accessible at http://www.editorialsystem.com/mms

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    Abstracting & Indexing

    Metrology and Measurement Systems is covered by the following services:

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    • Ulrich's Periodicals Directory/ulrichsweb
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    • WorldCat (OCLC)

    Editorial Information

    Janusz Smulko, Gdansk University of Technology, Poland

    International Programme Committee
    Roman Z. Morawski, Chairman, Warsaw University of Technology, Poland
    Eric Benoit, Université de Savoie, France
    Wojtek J. Bock, Université du Québec en Outaouais, Canada
    Martin Burghoff, Physikalisch-Technische Bundesanstalt, Germany
    Ramachandra R. Dasari, Massachusetts Institute of Technology, USA
    Numan Durakbasa, Vienna University of Technology, Austria
    Mauricio N. Frota, Catholic University Rio de Janeiro, Brazil
    Marian P. Kaźmierkowski, Warsaw University of Technology, Poland
    Laszlo Kish, Texas A&M University, USA
    Włodek Kulesza, Blekinge Institute of Technology, Sweden
    Luca Mari, Cattaneo University, Italy
    Janusz Mroczka, Wroclaw University of Technology, Poland
    Sergey V. Muravyov, Tomsk Polytechnic University, Russia
    Jan Obrzut, National Institute of Standards and Technology, USA
    Toshiro Ono, Okayama University of Science, Japan
    Paul P.L. Regtien, University of Twente, The Netherlands
    Antoni Rogalski, Military University of Technology, Poland
    Antonio Cruz Serra, Institute of Telecommunications, Portugal
    Richard Thorn, Technical University of Łódź, Poland/ University of Bergen, Norway
    Rainer Tutsch, Technical University Braunschweig, Germany
    Leo van Biesen, Vrije Universiteit Brussel, Belgium
    Wiesław Woliński, Warsaw University of Technology, Poland

    Associate Editors
    Zbigniew Bielecki, Military University of Technology, Poland
    Marcantonio Catelani, University of Florence, Italy
    Vladimir Dimchev, Ss. Cyril and Methodius University, Macedonia
    Krzysztof Duda, AGH University of Science and Technology, Poland
    Janusz Gajda, AGH University of Science and Technology, Poland
    Teodor Gotszalk, Wroclaw University of Technology, Poland
    Domenico Grimaldi, University of Calabria, Italy
    Ireneusz Jabłoński, Wroclaw University of Technology, Poland
    Piotr Jasiński, Gdansk University of Technology, Poland
    Piotr Kisała, Lublin University of Technology, Poland
    Czesław Łukianowicz, Koszalin University of Technology, Poland
    Fernando Puente León, University Karlsruhe, Germany
    Remigiusz Rak, Warsaw University of Technology, Poland
    Roman Szewczyk, Warsaw University of Technology, Poland

    Language Editors
    Andrzej Stankiewicz, Gdansk University of Technology, Poland

    Technical Editors
    Agnieszka Kondratowicz, Gdansk University of Technology, Poland

    Editorial Office of Metrology and Measurement Systems

    tel.: (0-58) 347-1357

    Bogumiła Zuga 32A Str.
    01-811 Warsaw, Poland
    T: +48 22 701 50 15

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