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Metrology and Measurement Systems

The Journal of Committee on Metrology and Scientific Instrumentation of Polish Academy of Sciences

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2300-1941
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Volume 22, Issue 1

Issues

Simple Wide Frequency Range Impedance Meter Based on AD5933 Integrated Circuit

Konrad Chabowski
  • Wrocław University of Technology, Faculty of Microsystem Electronics and Photonics, Z. Janiszewskiego street 11/17, 50-372 Wrocław, Poland
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  • Other articles by this author:
  • De Gruyter OnlineGoogle Scholar
/ Tomasz Piasecki
  • Wrocław University of Technology, Faculty of Microsystem Electronics and Photonics, Z. Janiszewskiego street 11/17, 50-372 Wrocław, Poland
  • Other articles by this author:
  • De Gruyter OnlineGoogle Scholar
/ Andrzej Dzierka
  • Wrocław University of Technology, Faculty of Microsystem Electronics and Photonics, Z. Janiszewskiego street 11/17, 50-372 Wrocław, Poland
  • Other articles by this author:
  • De Gruyter OnlineGoogle Scholar
/ Karol Nitsch
  • Wrocław University of Technology, Faculty of Microsystem Electronics and Photonics, Z. Janiszewskiego street 11/17, 50-372 Wrocław, Poland
  • Other articles by this author:
  • De Gruyter OnlineGoogle Scholar
Published Online: 2015-02-20 | DOI: https://doi.org/10.1515/mms-2015-0006

Abstract

As it contains elements of complete digital impedance meter, the AD5933 integrated circuit is an interesting solution for impedance measurements. However, its use for measurements in a wide range of impedances and frequencies requires an additional digital and analogue circuitry. This paper presents the design and performance of a simple impedance meter based on the AD5933 IC. Apart from the AD5933 IC it consists of a clock generator with a programmable prescaler, a novel DC offset canceller for the excitation signal based on peak detectors and a current to voltage converter with switchable conversion ratios. The authors proposed a simple method for choosing the measurement frequency to minimalize errors resulting from the spectral leakage and distortion caused by a lack of an anti-aliasing filter in the DDS generator. Additionally, a novel method for the AD5933 IC calibration was proposed. It consists in a mathematical compensation of the systematic error occurring in the argument of the value returned from the AD5933 IC as a result. The performance of the whole system is demonstrated in an exemplary measurement.

Keywords: impedance; converter; AD5933; SoC; system on a chip; measurement

References

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About the article

Received: 2014-02-12

Accepted: 2014-10-29

Published Online: 2015-02-20

Published in Print: 2015-03-01


Citation Information: Metrology and Measurement Systems, Volume 22, Issue 1, Pages 13–24, ISSN (Online) 2300-1941, DOI: https://doi.org/10.1515/mms-2015-0006.

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