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Opto-Electronics Review

Editor-in-Chief: Jaroszewicz, Leszek

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1896-3757
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Volume 15, Issue 2 (Jun 2007)

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Investigation of limitations of optical diffraction tomography

T. Kozacki
  • Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 Św. A. Boboli Str., 02-525, Warsaw, Poland
  • Email:
/ M. Kujawińska
  • Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 Św. A. Boboli Str., 02-525, Warsaw, Poland
  • Email:
/ P. Kniażewski
  • Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 Św. A. Boboli Str., 02-525, Warsaw, Poland
  • Email:
Published Online: 2007-06-01 | DOI: https://doi.org/10.2478/s11772-007-0006-8

Abstract

Optical diffraction tomography (ODT) applied to measurement of optical microelements is limited by low dynamic range, i.e., only objects with small deviations of refractive-index distribution can be measured. Therefore in this paper the limitations and errors of ODT are investigated throughout extensive numerical experiments. It is shown that these errors can be reduced by introduction of additional numerical focusing in the tomographic reconstruction algorithm. Additionally, new tomographic reconstruction algorithm using back propagation in reference medium for optical microelements measurement with known design is proposed. This hybrid reconstruction algorithm allows significant extension of ODT applicability in measurement of elements having large deviations of refractive-index distribution.

Keywords: optical diffraction tomography (ODT); propagation in inhomogeneous media; fiber optics characterization

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About the article

Published Online: 2007-06-01

Published in Print: 2007-06-01


Citation Information: Opto-Electronics Review, ISSN (Online) 1896-3757, DOI: https://doi.org/10.2478/s11772-007-0006-8. Export Citation

© 2007 SEP, Warsaw. This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License. (CC BY-NC-ND 3.0)

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