Jump to ContentJump to Main Navigation
Show Summary Details
More options …

Opto-Electronics Review

Editor-in-Chief: Jaroszewicz, Leszek

4 Issues per year

Open Access
Online
ISSN
1896-3757
See all formats and pricing
More options …
Volume 15, Issue 3 (Sep 2007)

Issues

Direct measurement of group dispersion of optical components using white-light spectral interferometry

R. Chlebus
  • Department of Physics, Technical University of Ostrava, 17. listopadu 15, 708-33, Ostrava-Poruba, Czech Republic
  • Email:
/ P. Hlubina
  • Department of Physics, Technical University of Ostrava, 17. listopadu 15, 708-33, Ostrava-Poruba, Czech Republic
  • Email:
/ D. Ciprian
  • Department of Physics, Technical University of Ostrava, 17. listopadu 15, 708-33, Ostrava-Poruba, Czech Republic
  • Email:
Published Online: 2007-09-01 | DOI: https://doi.org/10.2478/s11772-007-0010-z

Abstract

We present a simple white-light spectral interferometric technique employing a low-resolution spectrometer for a direct measurement of the group dispersion of optical components over a wide wavelength range. The technique utilizes an unbalanced Mach-Zehnder interferometer with a component under test inserted in one arm and the other arm with adjustable path length. We record a series of spectral interferograms to measure the equalization wavelength as a function of the path length difference. We measure the absolute group refractive index as a function of wavelength for a quartz crystal of known thickness and the relative one for optical fiber. In the latter case we use a microscope objective in front and a lens behind the fiber and subtract their group dispersion, which is measured by a technique of tandem interferometry including also a Michelson interferometer.

Keywords: spectral interferometry; white-light source; low-resolution spectrometer; Mach-Zehnder interferometer; group refractive index; dispersion; quartz crystal; holey fiber

  • [1] W.H. Knox, N.M. Pearson, K.D. Li, and C.A. Hirlimann, “Interferometric measurements of femtosecond group delay in optical components”, Opt. Lett. 13, 574–576 (1988). http://dx.doi.org/10.1364/OL.13.000574CrossrefGoogle Scholar

  • [2] S. Diddams and J.C. Diels, “Dispersion measurements with white-light interferometry”, J. Opt. Soc. B13, 1120–1128 (1995). Google Scholar

  • [3] M. Galli, F. Marabelli, and G. Gizzetti, “Direct measurement of refractive-index dispersion of transparent media by white-light interferometry”, Appl. Opt. 42, 3910–3914 (2003). Google Scholar

  • [4] C. Sainz, P. Jourdain, R. Escalona, and J. Calatroni, “Real time interferometric measurements of dispersion curves”, Opt. Commun. 110, 381–390 (1994). http://dx.doi.org/10.1016/0030-4018(94)90442-1CrossrefGoogle Scholar

  • [5] V.N. Kumar and D.N. Rao, “Using interference in the frequency domain for precise determination of the thickness and refractive indices of normal dispersive materials”, J. Opt. Soc. B12, 1559–1563 (1995). CrossrefGoogle Scholar

  • [6] Y. Liang and C.H. Grover, “Modified white-light Mach-Zehnder interferometer for direct group-delay measurements”, Appl. Opt. 37, 4105–4111 (1998). http://dx.doi.org/10.1364/AO.37.004105CrossrefGoogle Scholar

  • [7] H. Delbarre, C. Przygodzki, M. Tassou, and D. Boucher, “High-precision index measurement in anisotropic crystals using white-light spectral interferometry”, Appl. Phys. B70, 45–51 (2000). http://dx.doi.org/10.1007/s003400050006CrossrefGoogle Scholar

  • [8] P. Hlubina, “White-light spectral interferometry with the uncompensated Michelson interferometer and the group refractive index dispersion in fused silica”, Opt. Commun. 193, 1–7 (2001). http://dx.doi.org/10.1016/S0030-4018(01)01235-4CrossrefGoogle Scholar

  • [9] P. Hlubina and W. Urbanczyk, “Dispersion of the group birefringence of a calcite crystal measured by white-light spectral interferometry”, Meas. Sci. Technol. 16, 1267–1271 (2005). http://dx.doi.org/10.1088/0957-0233/16/6/005CrossrefGoogle Scholar

  • [10] P. Hlubina and I. Gurov, “Spectral interferograms including the equalization wavelengths processed by autoconvolution method”, Proc. SPIE 5064, 198–205 (2003). http://dx.doi.org/10.1117/12.501517CrossrefGoogle Scholar

  • [11] G. Ghosh, “Dispersion-equation coefficients for the refractive index and birefringence of calcite and quartz crystal”, Opt. Commun. 163, 95–102 (1999). http://dx.doi.org/10.1016/S0030-4018(99)00091-7CrossrefGoogle Scholar

  • [12] P. Hlubina, D. Ciprian, and L. Knyblová, “Direct measurement of dispersion of the group refractive indices of quartz crystal by white-light spectral interferometry”, Opt. Commun. 269, 8–13 (2007). http://dx.doi.org/10.1016/j.optcom.2006.07.049CrossrefGoogle Scholar

About the article

Published Online: 2007-09-01

Published in Print: 2007-09-01


Citation Information: Opto-Electronics Review, ISSN (Online) 1896-3757, DOI: https://doi.org/10.2478/s11772-007-0010-z.

Export Citation

© 2007 SEP, Warsaw. This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License. BY-NC-ND 3.0

Comments (0)

Please log in or register to comment.
Log in