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Opto-Electronics Review

Editor-in-Chief: Jaroszewicz, Leszek

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Volume 23, Issue 2


Review of night vision metrology

K. Chrzanowski
  • INFRAMET, 24 Graniczna St., Kwirynów, 05–082 Stare Babice, Poland
  • Military University of Technology, 2 Kaliskiego St., 00–908 Warsaw, Poland
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Published Online: 2015-04-07 | DOI: https://doi.org/10.1515/oere-2015-0024


A review of night vision metrology is presented in this paper. A set of reasons that create a rather chaotic metrologic situation on night vision market is presented. It is shown that there has been made a little progress in night vision metrology during last decades in spite of a big progress in night vision technology at the same period of time. It is concluded that such a big discrep- ancy between metrology development level and technology development can be an obstacle in the further development of night vision technology.

Keywords : metrology; night vision


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About the article

Published Online: 2015-04-07

Published in Print: 2015-06-01

Citation Information: Opto-Electronics Review, Volume 23, Issue 2, Pages 149–164, ISSN (Online) 1896-3757, ISSN (Print) 1230-3402, DOI: https://doi.org/10.1515/oere-2015-0024.

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