References
1 , 2012, no. , vol. , p. –10.1016/j.jhazmat.2012.07.001Parsons Chris, Grabulosa Eva Margui, Pili Eric, Floor Geerke H., Roman-Ross Gabriela, Charlet Laurent. Journal of Hazardous MaterialsJournal of Hazardous Materials03043894"Quantification of trace arsenic in soils by Field-Portable X-Ray Fluorescence Spectrometry: Considerations for sample preparation and measurement conditions" . Search in Google Scholar
2 , 2012, no. , vol. 76, p. 175–10.1016/j.sab.2012.06.005Reinsberg K.-G., Schumacher C., Tempez A., Nielsch K., Broekaert J.A.C. Spectrochimica Acta Part B: Atomic SpectroscopySpectrochimica Acta Part B: Atomic Spectroscopy05848547"Depth-profile analysis of thermoelectric layers on Si wafers by pulsed r.f. glow discharge time-of-flight mass spectrometry" . Search in Google Scholar
3 , 2010, no. 3, vol. 80, p. 223–10.1016/j.mimet.2009.12.010Peterson Greg, Bai Jianfa, Nagaraja T.G., Narayanan Sanjeev. Journal of Microbiological MethodsJ Microbiol Meths01677012"Diagnostic microarray for human and animal bacterial diseases and their virulence and antimicrobial resistance genes" . Search in Google Scholar
4 , 2009, no. 3-4, vol. 165, p. 265–10.1007/s00604-008-0131-1Dargel Rainer, Heinemeyer Frank, Köntges Marc, Vogt Jürgen, Vogt Carla. Microchimica ActaMicrochim Acta14365073"Detection of trace impurities in Cu(In, Ga)Se2 thin film solar cells by laser ablation ICP-MS" . Search in Google Scholar
5 , 2007, no. s1, vol. 4, p. 259–10.1002/ppap.200730713Micheli Victor, Laidani Nadhira, Bartali Ruben, Gottardi Gloria, Anderle Mariano. Plasma Processes and PolymersPlasma Process Polym16128869"Interface Effects Study in Hard–Soft Carbon Multilayered Films by AES Depth Profiling" . Search in Google Scholar
6 , 2003, no. 7, vol. 35, p. 556–10.1002/sia.1574Hofmann Siegfried. Surface and Interface AnalysisSurf Interface Anal10969918"Advances in sputter depth profiling using AES" . Search in Google Scholar
7 , 2003, no. 1-2, vol. 444, p. 120–10.1016/S0040-6090(03)01112-XWang J.Y., Hofmann S., Zalar A., Mittemeijer E.J. Thin Solid FilmsThis Solid Films00406090"Quantitative evaluation of sputtering induced surface roughness in depth profiling of polycrystalline multilayers using Auger electron spectroscopy" . Search in Google Scholar
8 , 2001, no. , vol. 398-399, p. 336–10.1016/S0040-6090(01)01340-2Hofmann Siegfried. Thin Solid FilmsThis Solid Films00406090"Profile reconstruction in sputter depth profiling" . Search in Google Scholar
9 , 1999, no. 9, vol. 27, p. 825–10.1002/(SICI)1096-9918(199909)27:9<825::AID-SIA638>3.0.CO;2-DHofmann Siegfried. Surface and Interface AnalysisSurf Interface Anal10969918"From depth resolution to depth resolution function: refinement of the concept for delta layers, single layers and multilayers" . Search in Google Scholar
10 , 1998, no. 7, vol. 61, p. 827–10.1088/0034-4885/61/7/002Hofmann S. Reports on Progress in PhysicsRep Prog Phys13616633"None" . Search in Google Scholar
11 , 1993, no. 13, vol. 20, p. 1061–10.1002/sia.740201306Fujita D., Kim K. J., Kajiwara K., Yoshihara K., Moon D. W. Surface and Interface AnalysisSurf Interface Anal10969918"GaAs/AlAs superlattice as a proposed new reference material for sputter depth profiling" . Search in Google Scholar
12 , 1991, no. 1, vol. 36, p. 35–10.1016/0079-6816(91)90013-THofmann S. Progress in Surface ScienceProg Surf Sci00796816"Compositional depth profiling by sputtering" . Search in Google Scholar
13 , 1989, no. 6-7, vol. 14, p. 407–10.1002/sia.740140619Seah M. P. Surface and Interface AnalysisSurf Interface Anal10969918"VAMAS surface chemical analysis technical working party: An update for 1988" . Search in Google Scholar
14 , 1988, no. 1-2, vol. 11, p. 103–10.1002/sia.740110113Powell C. J. Surface and Interface AnalysisSurf Interface Anal10969918"The development of standards for surface analysis" . Search in Google Scholar
15 , 1988, no. 5, vol. 332, p. 421–10.1007/BF00499263Fischmeister H. F. Fresenius Zeitschrift für Analytische ChemieFresenius Zeitschrift fur Analytische Chemie16182650"Applications of surface analysis in materials science and technology" . Search in Google Scholar
16 , 1986, no. 5, vol. 323, p. 421–10.1007/BF00470757Grasserbauer M., Stingeder G., Pötzl H., Guerrero E. Fresenius Zeitschrift für Analytische ChemieFresenius Zeitschrift fur Analytische Chemie16182650"Analytical science for the development of microelectronic devices" . Search in Google Scholar
17 , 1980, no. 2, vol. 16, p. 187–10.1080/05704928008081712Chaudhar Sunetra N. Kar, Cheng K. L. Applied Spectroscopy ReviewsAppl Sp Rev1520569X"Recent Study of Solid Surfaces by Photoelectron Spectroscopy" . Search in Google Scholar
© 2013 Walter de Gruyter GmbH, Berlin/Boston