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Pure and Applied Chemistry

The Scientific Journal of IUPAC

Ed. by Burrows, Hugh / Stohner, Jürgen


IMPACT FACTOR 2018: 2.350
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CiteScore 2018: 4.66

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Volume 65, Issue 11

Issues

Depth of origin of sputtered atoms (Technical Report)

M. J. Pellin / J. W. Burnett
Published Online: 2009-01-01 | DOI: https://doi.org/10.1351/pac199365112361

About the article

Published Online: 2009-01-01

Published in Print: 1993-01-01


Citation Information: Pure and Applied Chemistry, Volume 65, Issue 11, Pages 2361–2372, ISSN (Online) 1365-3075, ISSN (Print) 0033-4545, DOI: https://doi.org/10.1351/pac199365112361.

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