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Open Physics

formerly Central European Journal of Physics

Editor-in-Chief: Seidel, Sally

Managing Editor: Lesna-Szreter, Paulina

1 Issue per year


IMPACT FACTOR 2016 (Open Physics): 0.745
IMPACT FACTOR 2016 (Central European Journal of Physics): 0.765

CiteScore 2016: 0.82

SCImago Journal Rank (SJR) 2015: 0.458
Source Normalized Impact per Paper (SNIP) 2015: 1.142

Open Access
Online
ISSN
2391-5471
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Volume 6, Issue 2

Issues

Determination of thin film refractive index and thickness by means of film phase thickness

Milen Nenkov / Tamara Pencheva
Published Online: 2008-03-26 | DOI: https://doi.org/10.2478/s11534-008-0035-z

Abstract

A new approach for determination of refractive index dispersion n(λ) (the real part of the complex refractive index) and thickness d of thin films of negligible absorption and weak dispersion is proposed. The calculation procedure is based on determination of the phase thickness of the film in the spectral region of measured transmittance data. All points of measured spectra are included in the calculations. Barium titanate thin films are investigated in the spectral region 0.38–0.78 μm and their n(λ) and d are calculated. The approach is validated using Swanepoel’s method and it is found to be applicable for relatively thin films when measured transmittance spectra have one minimum and one maximum only.

PACS: 78.20.-e; 78.20.Ci

Keywords: thin films; refractive index; barium titanate

  • [1] J.C. Manifacier, J. Gasiot, J. P. Fillard, J. Phys. E 9, 1002 (1976) http://dx.doi.org/10.1088/0022-3735/9/11/032CrossrefGoogle Scholar

  • [2] R. Swanepoel, J. Phys. E 16, 1214 (1983) http://dx.doi.org/10.1088/0022-3735/16/12/023CrossrefGoogle Scholar

  • [3] D. Minkov, R. Swanepoel, Opt. Eng. 32, 3333 (1993) http://dx.doi.org/10.1117/12.151287CrossrefGoogle Scholar

  • [4] J.M. Gonzalez-Leal, R. Prieto-Alcon, J.A. Angel, D.A. Minkov, E. Marquez, Appl. Opt. 41, 7300 (2002) http://dx.doi.org/10.1364/AO.41.007300CrossrefGoogle Scholar

  • [5] Q. Ren, C. B. Ma, J. Mater. Sci. Lett. 19, 7 (2000) http://dx.doi.org/10.1023/A:1006727109684CrossrefGoogle Scholar

  • [6] D.J. Won, C.H. Wang, H.K. Jang, D.J. Choi, Appl. Phys. A 73, 595 (2001) Google Scholar

  • [7] K. Ayadi, N. Haddaoui, J. Mater. Sci. — Mater. El. 11, 163 (2000) http://dx.doi.org/10.1023/A:1008937700655CrossrefGoogle Scholar

  • [8] L.I. Soliman, Al.M. Ibrahim, Fizika A 6, 181 (1997) Google Scholar

  • [9] D. Poelman, Ph. F. Smet, J. Phys. D 36, 1850 (2003) http://dx.doi.org/10.1088/0022-3727/36/15/316CrossrefGoogle Scholar

  • [10] Sh.C. Chiao, B.G. Bovard, H.A. Macleod, Appl. Opt. 34, 7355 (1995) Google Scholar

  • [11] J.A. Dobrowolski, F.C. Ho, A. Waldorf, Appl. Opt. 22, 3191 (1983) http://dx.doi.org/10.1364/AO.22.003191CrossrefGoogle Scholar

  • [12] T. Pencheva, M. Nenkov, J. Mod. Optic. 43, 2449 (1996) Google Scholar

  • [13] M. Nenkov, T. Pencheva, J. Opt. Soc. Am. A 15, 1852 (1998) http://dx.doi.org/10.1364/JOSAA.15.001852CrossrefGoogle Scholar

  • [14] E.G. Birgin, I. Chambouleyron, J.M. Martínez, J. Comput. Phys. 151, 862, (1999) http://dx.doi.org/10.1006/jcph.1999.6224CrossrefGoogle Scholar

  • [15] S. Ventura, E. G. Birgin, J. M. Martínez, I. Chamboulegron, J. Appl. Phys. 97, 043512 (2005) Google Scholar

  • [16] H. A. Macleod, Thin film optical filters, 2nd edition (Adam Hilger Ltd, Bristol, 1986) Google Scholar

  • [17] M. R. Craven, W. M. Cranton, S. Toal, H. S. Reehal, Semicond. Sci. Technol. 13, 404 (1998) http://dx.doi.org/10.1088/0268-1242/13/4/009CrossrefGoogle Scholar

  • [18] K. Sreenivas, A. Mansingh, M. Sawyeeer, J. Appl. Phys. 62, 4475 (1987) http://dx.doi.org/10.1063/1.339037CrossrefGoogle Scholar

  • [19] T. Pencheva, M. Nenkov, Vacuum. 48, 43 (1997) http://dx.doi.org/10.1016/S0042-207X(96)00210-2CrossrefGoogle Scholar

  • [20] E. D. Palik, Handbook of optical constants of solids (Academic press, San Diego USA, 1998) Google Scholar

About the article

Published Online: 2008-03-26

Published in Print: 2008-06-01


Citation Information: Open Physics, Volume 6, Issue 2, Pages 332–343, ISSN (Online) 2391-5471, DOI: https://doi.org/10.2478/s11534-008-0035-z.

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© 2008 Versita Warsaw. This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License. BY-NC-ND 3.0

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