Jump to ContentJump to Main Navigation
Show Summary Details
Volume 37, Issue 4

Issues

Quality of Experience: Terminology, Methods and Applications

Sebastian Möller
  • Corresponding author
  • Quality and Usability Lab, Telekom Innovation Laboratories, TU Berlin, Sekr. TEL. 18, Ernst-Reuter-Platz 7, 10587 Berlin, Germany
  • Email
  • Other articles by this author:
  • De Gruyter OnlineGoogle Scholar
/ Alexander Raake
Published Online: 2014-10-25 | DOI: https://doi.org/10.1515/pik-2014-0027

Abstract

In this paper, we discuss how the concept of Quality of Experience (QoE) has evolved during the last two decades, resulting in a need for a common terminology, as well as the need for applying the identified concepts to new applications and services. Regarding the first issue, we review the development of definitions of quality and QoE, and summarize the latest status which resulted in the ‘Qualinet White Paper on Definitions of Quality of Experience’, the history of which will be briefly reviewed, pointing out recent further developments. Regarding the second issue, we summarize methods and applications which have been collected in a recently edited book following the Qualinet White Paper, and which the present paper is largely based on.

About the article

Published Online: 2014-10-25

Published in Print: 2014-12-01


Citation Information: PIK - Praxis der Informationsverarbeitung und Kommunikation, Volume 37, Issue 4, Pages 255–263, ISSN (Online) 1865-8342, ISSN (Print) 0930-5157, DOI: https://doi.org/10.1515/pik-2014-0027.

Export Citation

© 2014 by Walter de Gruyter GmbH, Berlin/Munich/Boston.Get Permission

Citing Articles

Here you can find all Crossref-listed publications in which this article is cited. If you would like to receive automatic email messages as soon as this article is cited in other publications, simply activate the “Citation Alert” on the top of this page.

[1]
Stefan Uhrig, Sebastian Arndt, Sebastian Möller, and Jan-Niklas Voigt-Antons
Quality and User Experience, 2017, Volume 2, Number 1

Comments (0)

Please log in or register to comment.
Log in