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tm - Technisches Messen

Plattform für Methoden, Systeme und Anwendungen der Messtechnik

[TM - Technical Measurement: A Platform for Methods, Systems, and Applications of Measurement Technology
]

Editor-in-Chief: Puente León, Fernando / Zagar, Bernhard


IMPACT FACTOR increased in 2015: 0.179

SCImago Journal Rank (SJR) 2015: 0.171
Source Normalized Impact per Paper (SNIP) 2015: 0.223
Impact per Publication (IPP) 2015: 0.147

    99,00 € / $149.00 / £75.00*

    Online
    ISSN
    2196-7113
    See all formats and pricing
    
 
 


    Select Volume and Issue

    Issues

    Overview

    tm - technisches messen is proud to announce a new feature, the Editor’s Choice free access article. To download the featured article free of charge, please click the link below.

    Vol. 83, Iss. 12: Vergleichsproben aus Silizium für die Flächenrauheit by Joachim Frühauf, Eva Gärtner, Ludger Koenders and Andre Felgner

    Vol. 83, Iss. 12: Downstream relaxation of velocity profiles in pipe-flow with swirl disturbances by Simon Graner, Denis F. Hinz and Christian Breitsamter

    Vol. 83, Iss. 10: Inline imaging-ellipsometer for printed electronics by Florian Huemer, Murad Jamalieh, Ferndinand Bammer and Dirk Hönig

    Vol. 83, Iss. 10: Setup of a large-scale test field for distributed soil gas sensors and testing of a monitoring method based on tomography by Patrick P. Neumann, Klaus-Dieter Werner, Sergej Petrov and Detlef Lazik

    Vol. 83, Iss. 9: Creating precise reference data for 3D head pose estimation by Sebastian Vater, Johannes Pallauf, Marian Hoffman, Thorsten Stein and Fernando Puente León

    Vol. 83, Iss. 1: Noise equalisation and quasi loss-less image data compression – or how many bits needs an image sensor? by Bernd Jähne and Martin Schwarzbauer

    Your benefits

    • Professional journal for application-based industrial measurement as one of the essential components of automation, process monitoring, quality control and safety engineering
    • Official organ of AMA (The Association for Sensor Technology) and NAMUR (The Process-Industry Interest Group for Automation Technology)
    • Includes notifications from GMA (The VDI/VDE Society for Measurement and Automatic Control)
    • Renowned Editorial Board
    • High-quality contributions
    • Special issues
    • Print- and online-publication

    Aims and Scope

    Objective

    The journal promotes dialogue between the developers of application-oriented sensors, measurement systems, and measurement methods and the manufacturers and measurement technologists who use them.

    Topics

    • The manufacture and characteristics of new sensors for measurement technology in the industrial sector
    • New measurement methods
    • Hardware and software based processing and analysis of measurement signals to obtain measurement values
    • The outcomes of employing new measurement systems and methods

    Details

    OLDENBOURG WISSENSCHAFTSVERLAG
    Language:
    German, English
    Type of Publication:
    Journal
    Readership:

    developers, manufacturers, measurement technologists

    Submission of Manuscripts

    Instructions for Authors

    Article formats

    Research articles

    Your benefits of publishing with us

    Submission

    You can easily submit your manuscript online. Simply go to...

    http://mc.manuscriptcentral.com/teme

    ...and you will be guided through the whole peer-reviewing and publishing process.

    Submission process

    Please note

    We look forward to receiving your manuscript!

    More ...

    History

    tm – technisches messen was founded in 1931.

    Abstracting & Indexing

    tm - Technisches Messen is covered by the following services:

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    • Clarivate Analytics - Current Contents/Engineering, Computing, and Technology
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    • Elsevier - Compendex
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    • Elsevier - Reaxys
    • Elsevier - SCOPUS
    • Genamics JournalSeek
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    • KESLI-NDSL (Korean National Discovery for Science Leaders)
    • Microsoft Academic
    • Naviga (Softweco)
    • Primo Central (ExLibris)
    • ReadCube
    • ResearchGate
    • SCImago (SJR)
    • Summon (Serials Solutions/ProQuest)
    • TDNet
    • TEMA Technik und Management
    • WanFang Data
    • WorldCat (OCLC)

    Editorial Information

    Editor

    Prof. Dr.-Ing. F. Puente León, Karlsruhe
    Prof. Dr.-Ing. B. Zagar, Linz

    Editorial Board

    Prof. Dr.-Ing. J. Beyerer, Karlsruhe
    Prof. Dr.-Ing. J. Czarske, Dresden
    Prof. Dr.-Ing. G. Fischerauer, Bayreuth
    Prof. Dr. Th. Fröhlich, Ilmenau
    Prof. Dr. G. Gerlach, Dresden
    Prof. Dr.-Ing. M. Heizmann, Karlsruhe
    Dr.-Ing. F. Höller, Carl Zeiss AG, Oberkochen
    Prof. Dr. techn. Dr.-Ing. M. Kaltenbacher, Wien
    Prof. Dr.-Ing. O. Kanoun, Chemnitz
    Prof. Dr. M. Kreutzbruck, Stuttgart
    Prof. Dr.-Ing. R. Lerch, Erlangen
    Prof. Dr. R. Z. Morawski, Warschau
    Dr. T. Pechstein, Waldheim
    Prof.-Ing. P. Ripka, Prag
    Prof. Dr.-Ing. K.-D. Sommer, Ilmenau
    Prof. Dr. R. Tutsch, Braunschweig
    Prof. Dr. R. Werthschützky, Darmstadt


    Journal Manager

    DE GRUYTER
    Genthiner Strasse 13
    10785 Berlin, Germany
    +49 30.260 05-344
    ulrike.kitzing@degruyter.com

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