Jump to ContentJump to Main Navigation
Show Summary Details

tm - Technisches Messen

Plattform für Methoden, Systeme und Anwendungen der Messtechnik

[TM - Technical Measurement: A Platform for Methods, Systems, and Applications of Measurement Technology

Editor-in-Chief: Puente León, Fernando / Zagar, Bernhard

IMPACT FACTOR increased in 2015: 0.179

SCImago Journal Rank (SJR) 2015: 0.171
Source Normalized Impact per Paper (SNIP) 2015: 0.223
Impact per Publication (IPP) 2015: 0.147

    99,00 € / $149.00 / £75.00*

    See all formats and pricing

    Select Volume and Issue



    tm - technisches messen is proud to announce a new feature, the Editor’s Choice free access article. To download the featured article free of charge, please click the link below.

    Vol. 83, Iss. 12: Vergleichsproben aus Silizium für die Flächenrauheit by Joachim Frühauf, Eva Gärtner, Ludger Koenders and Andre Felgner

    Vol. 83, Iss. 12: Downstream relaxation of velocity profiles in pipe-flow with swirl disturbances by Simon Graner, Denis F. Hinz and Christian Breitsamter

    Vol. 83, Iss. 10: Inline imaging-ellipsometer for printed electronics by Florian Huemer, Murad Jamalieh, Ferndinand Bammer and Dirk Hönig

    Vol. 83, Iss. 10: Setup of a large-scale test field for distributed soil gas sensors and testing of a monitoring method based on tomography by Patrick P. Neumann, Klaus-Dieter Werner, Sergej Petrov and Detlef Lazik

    Vol. 83, Iss. 9: Creating precise reference data for 3D head pose estimation by Sebastian Vater, Johannes Pallauf, Marian Hoffman, Thorsten Stein and Fernando Puente León

    Vol. 83, Iss. 1: Noise equalisation and quasi loss-less image data compression – or how many bits needs an image sensor? by Bernd Jähne and Martin Schwarzbauer

    Your benefits

    • Professional journal for application-based industrial measurement as one of the essential components of automation, process monitoring, quality control and safety engineering
    • Official organ of AMA (The Association for Sensor Technology) and NAMUR (The Process-Industry Interest Group for Automation Technology)
    • Includes notifications from GMA (The VDI/VDE Society for Measurement and Automatic Control)
    • Renowned Editorial Board
    • High-quality contributions
    • Special issues
    • Print- and online-publication

    Aims and Scope


    The journal promotes dialogue between the developers of application-oriented sensors, measurement systems, and measurement methods and the manufacturers and measurement technologists who use them.


    • The manufacture and characteristics of new sensors for measurement technology in the industrial sector
    • New measurement methods
    • Hardware and software based processing and analysis of measurement signals to obtain measurement values
    • The outcomes of employing new measurement systems and methods


    German, English
    Type of Publication:

    developers, manufacturers, measurement technologists

    Submission of Manuscripts

    Instructions for Authors

    Article formats

    Research articles

    Your benefits of publishing with us


    You can easily submit your manuscript online. Simply go to...


    ...and you will be guided through the whole peer-reviewing and publishing process.

    Submission process

    Please note

    We look forward to receiving your manuscript!

    More ...


    tm – technisches messen was founded in 1931.

    Abstracting & Indexing

    tm - Technisches Messen is covered by the following services:

    • Baidu Scholar
    • Cabell's Directory
    • Celdes
    • Clarivate Analytics - Current Contents/Engineering, Computing, and Technology
    • Clarivate Analytics - Journal Citation Reports/Science Edition
    • Clarivate Analytics - Science Citation Index Expanded
    • CNKI Scholar (China National Knowledge Infrastructure)
    • CNPIEC
    • EBSCO (relevant databases)
    • EBSCO Discovery Service
    • Elsevier - Compendex
    • Elsevier - Engineering Village
    • Elsevier - Reaxys
    • Elsevier - SCOPUS
    • Genamics JournalSeek
    • Google Scholar
    • Inspec
    • J-Gate
    • JournalTOCs
    • KESLI-NDSL (Korean National Discovery for Science Leaders)
    • Microsoft Academic
    • Naviga (Softweco)
    • Primo Central (ExLibris)
    • ReadCube
    • ResearchGate
    • SCImago (SJR)
    • Summon (Serials Solutions/ProQuest)
    • TDNet
    • TEMA Technik und Management
    • WanFang Data
    • WorldCat (OCLC)

    Editorial Information


    Prof. Dr.-Ing. F. Puente León, Karlsruhe
    Prof. Dr.-Ing. B. Zagar, Linz

    Editorial Board

    Prof. Dr.-Ing. J. Beyerer, Karlsruhe
    Prof. Dr.-Ing. J. Czarske, Dresden
    Prof. Dr.-Ing. G. Fischerauer, Bayreuth
    Prof. Dr. Th. Fröhlich, Ilmenau
    Prof. Dr. G. Gerlach, Dresden
    Prof. Dr.-Ing. M. Heizmann, Karlsruhe
    Dr.-Ing. F. Höller, Carl Zeiss AG, Oberkochen
    Prof. Dr. techn. Dr.-Ing. M. Kaltenbacher, Wien
    Prof. Dr.-Ing. O. Kanoun, Chemnitz
    Prof. Dr. M. Kreutzbruck, Stuttgart
    Prof. Dr.-Ing. R. Lerch, Erlangen
    Prof. Dr. R. Z. Morawski, Warschau
    Dr. T. Pechstein, Waldheim
    Prof.-Ing. P. Ripka, Prag
    Prof. Dr.-Ing. K.-D. Sommer, Ilmenau
    Prof. Dr. R. Tutsch, Braunschweig
    Prof. Dr. R. Werthschützky, Darmstadt

    Journal Manager

    Genthiner Strasse 13
    10785 Berlin, Germany
    +49 30.260 05-344

    Comments (0)

    Please log in or register to comment.