Jump to ContentJump to Main Navigation
Show Summary Details
More options …

tm - Technisches Messen

Plattform für Methoden, Systeme und Anwendungen der Messtechnik

[TM - Technical Measurement: A Platform for Methods, Systems, and Applications of Measurement Technology
]

Editor-in-Chief: Puente León, Fernando / Zagar, Bernhard

12 Issues per year


IMPACT FACTOR 2016: 0.348

CiteScore 2017: 0.46

SCImago Journal Rank (SJR) 2017: 0.239
Source Normalized Impact per Paper (SNIP) 2017: 0.566

Online
ISSN
2196-7113
See all formats and pricing
Online
Institutional Subscription
€ [D] 501.00 / US$ 676.00 / GBP 410.00*
Individual Subscription
€ [D] 99.00 / US$ 149.00 / GBP 80.00*
Print
Institutional Subscription
€ [D] 501.00 / US$ 676.00 / GBP 410.00*
Individual Subscription
€ [D] 501.00 / US$ 676.00 / GBP 410.00*
Print + Online
Institutional Subscription
€ [D] 577.00 / US$ 779.00 / GBP 473.00*
Individual Subscription
€ [D] 565.00 / US$ 764.00 / GBP 464.00*
*Prices in US$ apply to orders placed in the Americas only. Prices in GBP apply to orders placed in Great Britain only. Prices in € represent the retail prices valid in Germany (unless otherwise indicated). Prices are subject to change without notice. Prices do not include postage and handling if applicable. RRP: Recommended Retail Price.
More options …
Just Accepted

Issues

Volume 85 (2018)

Volume 84 (2017)

Volume 83 (2016)

Volume 82 (2015)

Volume 81 (2014)

Volume 80 (2013)

Volume 79 (2012)

Volume 78 (2011)

Volume 77 (2010)

Volume 76 (2009)

Volume 75 (2008)

Volume 74 (2007)

Volume 73 (2006)

Volume 72 (2005)

Volume 71 (2004)

Volume 70 (2003)

Volume 69 (2002)

Volume 68 (2001)

Volume 67 (2000)

Volume 66 (1999)

Volume 65 (1998)

Volume 64 (1997)

Volume 63 (1996)

Volume 62 (1995)

Volume 61 (1994)

Volume 60 (1993)

Volume 59 (1992)

Volume 58 (1991)

Volume 57 (1990)

Volume 56 (1989)

Volume 55 (1988)

Volume 54 (1987)

Volume 53 (1986)

Volume 52 (1985)

Volume 51 (1984)

Volume 50 (1983)

Volume 49 (1982)

Volume 48 (1981)

Volume 47 (1980)

Volume 514-524 (1979)

Volume 501 (1977)

Volume 492 (1977)

Volume 493 (1977)

Volume 494 (1977)

Volume 500 (1977)

Volume 498 (1977)

Volume 496 (1977)

Volume 499 (1977)

Volume 497 (1977)

Volume 502 (1977)

Volume 480-491 (1976)

Volume 468-479 (1975)

Volume 456-467 (1974)

Volume 444-455 (1973)

Volume 432-443 (1972)

Volume 420-431 (1971)

Volume 408-419 (1970)

Volume 396-407 (1969)

Volume 384-395 (1968)

Volume 372-383 (1967)

Volume 360-371 (1966)

Volume 355 (1965)

Volume 356 (1965)

Volume 359 (1965)

Volume 350 (1965)

Volume 358 (1965)

Volume 351 (1965)

Volume 352 (1965)

Volume 349 (1965)

Volume 357 (1965)

Volume 353 (1965)

Volume 354 (1965)

Volume 336-347 (1964)

Volume 331 (1963)

Volume 327 (1963)

Volume 333 (1963)

Volume 324 (1963)

Volume 329 (1963)

Volume 330 (1963)

Volume 335 (1963)

Volume 326 (1963)

Volume 332 (1963)

Volume 328 (1963)

Volume 334 (1963)

Volume 325 (1963)

Volume 312-323 (1962)

Volume 300-311 (1961)

Volume 288-299 (1960)

Volume 276-287 (1959)

Volume 252-263 (1957)

Volume 240-251 (1956)

Volume 204-215 (1953)

Volume 192-203 (1952)

Volume 180-191 (1951)

Volume 168-179 (1950)

Volume 156-167 (1948)

Volume 145-155 (1943)

Volume 133-144 (1942)

Volume 121-132 (1941)

Volume 97-108 (1939)

Volume 85-96 (1938)

Volume 73-84 (1937)

Volume 61-72 (1936)

Volume 49-60 (1935)

Volume 37-48 (1934)

Volume 25-36 (1933)

Volume 13-24 (1932)

Volume 1-12 (1931)

Messungen mit Quarz-Meßwertaufnehmern V 132-21 und Elektrometer-Verstärkern

Paul E. Klein
| DOI: https://doi.org/10.1524/teme.1962.312323.jg.231

30,00 € / $42.00 / £23.00

Get Access to Full Text

About the article

Published in Print: 1962-12-01

Citation Information: tm - Technisches Messen, Volume 312-323, Issue JG, Pages 231–234, ISSN (Online) 2196-7113, ISSN (Print) 0171-8096, DOI: https://doi.org/10.1524/teme.1962.312323.jg.231.

Export Citation

© 2014 Oldenbourg Wissenschaftsverlag GmbH, Rosenheimer Str. 145, 81671 München.Get Permission

Comments (0)

Please log in or register to comment.
Log in