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tm - Technisches Messen

Plattform für Methoden, Systeme und Anwendungen der Messtechnik

[TM - Technical Measurement: A Platform for Methods, Systems, and Applications of Measurement Technology
]

Editor-in-Chief: Puente León, Fernando / Zagar, Bernhard

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Rechnergestützte Qualitätsprüfung als Basis für die gezielte Prozeßoptimierung / Computer aided quality inspection as a basis for the optimization of processes

T. Pfeifer / Β. Gimpel
| DOI: https://doi.org/10.1524/teme.1990.57.jg.60

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Published in Print: 1990-12-01

Citation Information: tm - Technisches Messen, Volume 57, Issue JG, Pages 60–64, ISSN (Online) 2196-7113, ISSN (Print) 0171-8096, DOI: https://doi.org/10.1524/teme.1990.57.jg.60.

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