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tm - Technisches Messen

Plattform für Methoden, Systeme und Anwendungen der Messtechnik

[TM - Technical Measurement: A Platform for Methods, Systems, and Applications of Measurement Technology
]

Editor-in-Chief: Puente León, Fernando / Zagar, Bernhard


IMPACT FACTOR 2017: 0.476

CiteScore 2017: 0.46

SCImago Journal Rank (SJR) 2017: 0.239
Source Normalized Impact per Paper (SNIP) 2017: 0.566

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ISSN
2196-7113
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Frequenzmessung an Motoren und Frequenzumformern (Frequency Measurement of Motors and Frequency Converters)

Z. Liu / Jörg Himmel / Karl-Walter Bonfig
Published Online: 2009-09-25 | DOI: https://doi.org/10.1524/teme.2002.69.11.461

In modernen Prüffeldern zur Warenendkontrolle dienen halbleitergesteuerte Frequenzumformer zur Einstellung der Drehzahl. Diese Systeme verursachen erhebliche Störungen der Strom- und Spannungssignale. Aus diesen Signalen müssen alle elektrischen Kenngrößen berechnet werden. Eine besondere Bedeutung haben dabei die Frequenz und Phasenlage. In diesem Beitrag wird ein mathematischer Algorithmus vorgestellt, der zur Berechnung von Frequenz und Phasenlage bei guter Unterdrückung dieser Störungen eingesetzt werden kann.

In modern test labs for final inspection and testing semiconductor-controlled frequency converters are frequently used for adjusting the speed. These systems cause significant interference with current and voltage signals. All electrical parameters must be calculated from these signals. The frequency and phase levels are of particular importance. A mathematical algorithm is presented in this article for calculating frequency and phase levels for an efficient suppression of the interference.

About the article

Published Online: 2009-09-25

Published in Print: 2002-11-01


Citation Information: tm – Technisches Messen Plattform für Methoden, Systeme und Anwendungen der Messtechnik, Volume 69, Issue 11/2002, Pages 461–, ISSN (Print) 0171-8096, DOI: https://doi.org/10.1524/teme.2002.69.11.461.

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[1]
Z. Liu, J. Himmel, and K.W. Bonfig
IEEE Transactions on Power Delivery, 2005, Volume 20, Number 4, Page 2370

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