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tm - Technisches Messen

Plattform für Methoden, Systeme und Anwendungen der Messtechnik

[TM - Technical Measurement: A Platform for Methods, Systems, and Applications of Measurement Technology
]

Editor-in-Chief: Puente León, Fernando / Zagar, Bernhard


IMPACT FACTOR 2018: 0.594

CiteScore 2018: 0.54

SCImago Journal Rank (SJR) 2018: 0.261
Source Normalized Impact per Paper (SNIP) 2018: 0.563

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2196-7113
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Charakterisierung von Flüssigkristalllichtmodulatoren für die Rekonstruktion digitaler Hologramme (Investigation and Qualification of Spatial Light Modulators for the Reconstruction of Digital Holograms)

Christian Kohler / Xavier Schwab / Wolfgang Osten / Torsten Baumbach
Published Online: 2009-09-25 | DOI: https://doi.org/10.1524/teme.2006.73.3.157

Abstract

Für die digitale Holografie (DH) und die vergleichende digitale Holografie (CDH) werden computeradressierbare Modulatoren zur Hologrammrekonstruktion benötigt. Um qualitativ hochwertige Hologramme mit hoher Beugungseffizienz rekonstruieren zu können, müssen die Eigenschaften der Modulatoren genau bekannt sein. Dies macht eine Charakterisierung der Modulatoren im Hinblick auf Amplitudenmodulation, Phasenmodulation, Beugungseffizienz und Oberflächentopografie notwendig.

Summary

For digital holography (DH) and comparative digital holography (CDH) computer addressable modulators are needed. To ensure high quality reconstructions with good diffraction efficiency the modulators’ properties have to be known. Therefore a characterization of the modulators with respect to amplitude modulation, phase modulation, diffraction efficiency and surface geometry is required.

Keywords: digital holography; comparative digital holography; LCOS; phase modulation

About the article

Published Online: 2009-09-25

Published in Print: 2006-03-01


Citation Information: tm - Technisches Messen, Volume 73, Issue 3/2006, Pages 157–165, ISSN (Print) 0171-8096, DOI: https://doi.org/10.1524/teme.2006.73.3.157.

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[1]
C. Kohler, T. Haist, X. Schwab, and W. Osten
Optics Express, 2008, Volume 16, Number 19, Page 14853

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